X-ray diffraction residual stress calculation on textured La 2/3Sr 1/3MnO 3 thin film

Lamartine Meda, Klaus H. Dahmen, Saleh Hayek, Hamid Garmestani

Research output: Contribution to journalArticle

20 Citations (Scopus)

Abstract

Residual stresses and texture in La 2/3Sr 1/3MnO 3 (LSMO) thin films have been investigated. The films were deposited on (100) LaAlO 3 (LAO) and (100) MgO single crystals by liquid delivery-metal organic chemical vapor deposition (LD-MOCVD). X-ray diffraction (XRD) pole figures showed (001) LSMO//(001) LAO and (001) LSMO//(001) MgO preferred orientation. Residual stresses were calculated using a modified sin 2ψ method, crystallite group method (CGM), assuming a biaxial stress state. Compressive stresses on the order of 224 and 1150MPa were obtained for LSMO films deposited on LAO (LSMO/LAO) and MgO (LSMO/MgO), respectively.

Original languageEnglish
Pages (from-to)185-191
Number of pages7
JournalJournal of Crystal Growth
Volume263
Issue number1-4
DOIs
Publication statusPublished - 1 Mar 2004
Externally publishedYes

Fingerprint

stress analysis
residual stress
Residual stresses
Organic Chemicals
X ray diffraction
Liquid Crystals
Thin films
Organic chemicals
thin films
Compressive stress
diffraction
metalorganic chemical vapor deposition
Chemical vapor deposition
Poles
delivery
x rays
poles
textures
Textures
Metals

Keywords

  • A1. Residual stresses
  • A1. Texture
  • A1. X-ray diffraction
  • A2. Metalorganic chemical vapor deposition
  • B1. La Sr MnO (LSMO)
  • B1. Manganites

ASJC Scopus subject areas

  • Condensed Matter Physics

Cite this

X-ray diffraction residual stress calculation on textured La 2/3Sr 1/3MnO 3 thin film. / Meda, Lamartine; Dahmen, Klaus H.; Hayek, Saleh; Garmestani, Hamid.

In: Journal of Crystal Growth, Vol. 263, No. 1-4, 01.03.2004, p. 185-191.

Research output: Contribution to journalArticle

Meda, Lamartine ; Dahmen, Klaus H. ; Hayek, Saleh ; Garmestani, Hamid. / X-ray diffraction residual stress calculation on textured La 2/3Sr 1/3MnO 3 thin film. In: Journal of Crystal Growth. 2004 ; Vol. 263, No. 1-4. pp. 185-191.
@article{a2da04c82ae2404494c7e05da04d8251,
title = "X-ray diffraction residual stress calculation on textured La 2/3Sr 1/3MnO 3 thin film",
abstract = "Residual stresses and texture in La 2/3Sr 1/3MnO 3 (LSMO) thin films have been investigated. The films were deposited on (100) LaAlO 3 (LAO) and (100) MgO single crystals by liquid delivery-metal organic chemical vapor deposition (LD-MOCVD). X-ray diffraction (XRD) pole figures showed (001) LSMO//(001) LAO and (001) LSMO//(001) MgO preferred orientation. Residual stresses were calculated using a modified sin 2ψ method, crystallite group method (CGM), assuming a biaxial stress state. Compressive stresses on the order of 224 and 1150MPa were obtained for LSMO films deposited on LAO (LSMO/LAO) and MgO (LSMO/MgO), respectively.",
keywords = "A1. Residual stresses, A1. Texture, A1. X-ray diffraction, A2. Metalorganic chemical vapor deposition, B1. La Sr MnO (LSMO), B1. Manganites",
author = "Lamartine Meda and Dahmen, {Klaus H.} and Saleh Hayek and Hamid Garmestani",
year = "2004",
month = "3",
day = "1",
doi = "10.1016/j.jcrysgro.2003.10.055",
language = "English",
volume = "263",
pages = "185--191",
journal = "Journal of Crystal Growth",
issn = "0022-0248",
publisher = "Elsevier",
number = "1-4",

}

TY - JOUR

T1 - X-ray diffraction residual stress calculation on textured La 2/3Sr 1/3MnO 3 thin film

AU - Meda, Lamartine

AU - Dahmen, Klaus H.

AU - Hayek, Saleh

AU - Garmestani, Hamid

PY - 2004/3/1

Y1 - 2004/3/1

N2 - Residual stresses and texture in La 2/3Sr 1/3MnO 3 (LSMO) thin films have been investigated. The films were deposited on (100) LaAlO 3 (LAO) and (100) MgO single crystals by liquid delivery-metal organic chemical vapor deposition (LD-MOCVD). X-ray diffraction (XRD) pole figures showed (001) LSMO//(001) LAO and (001) LSMO//(001) MgO preferred orientation. Residual stresses were calculated using a modified sin 2ψ method, crystallite group method (CGM), assuming a biaxial stress state. Compressive stresses on the order of 224 and 1150MPa were obtained for LSMO films deposited on LAO (LSMO/LAO) and MgO (LSMO/MgO), respectively.

AB - Residual stresses and texture in La 2/3Sr 1/3MnO 3 (LSMO) thin films have been investigated. The films were deposited on (100) LaAlO 3 (LAO) and (100) MgO single crystals by liquid delivery-metal organic chemical vapor deposition (LD-MOCVD). X-ray diffraction (XRD) pole figures showed (001) LSMO//(001) LAO and (001) LSMO//(001) MgO preferred orientation. Residual stresses were calculated using a modified sin 2ψ method, crystallite group method (CGM), assuming a biaxial stress state. Compressive stresses on the order of 224 and 1150MPa were obtained for LSMO films deposited on LAO (LSMO/LAO) and MgO (LSMO/MgO), respectively.

KW - A1. Residual stresses

KW - A1. Texture

KW - A1. X-ray diffraction

KW - A2. Metalorganic chemical vapor deposition

KW - B1. La Sr MnO (LSMO)

KW - B1. Manganites

UR - http://www.scopus.com/inward/record.url?scp=1242263875&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=1242263875&partnerID=8YFLogxK

U2 - 10.1016/j.jcrysgro.2003.10.055

DO - 10.1016/j.jcrysgro.2003.10.055

M3 - Article

VL - 263

SP - 185

EP - 191

JO - Journal of Crystal Growth

JF - Journal of Crystal Growth

SN - 0022-0248

IS - 1-4

ER -