X-ray diffraction residual stress calculation on textured La 2/3Sr 1/3MnO 3 thin film

Lamartine Meda, Klaus H. Dahmen, Saleh Hayek, Hamid Garmestani

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Residual stresses and texture in La 2/3Sr 1/3MnO 3 (LSMO) thin films have been investigated. The films were deposited on (100) LaAlO 3 (LAO) and (100) MgO single crystals by liquid delivery-metal organic chemical vapor deposition (LD-MOCVD). X-ray diffraction (XRD) pole figures showed (001) LSMO//(001) LAO and (001) LSMO//(001) MgO preferred orientation. Residual stresses were calculated using a modified sin 2ψ method, crystallite group method (CGM), assuming a biaxial stress state. Compressive stresses on the order of 224 and 1150MPa were obtained for LSMO films deposited on LAO (LSMO/LAO) and MgO (LSMO/MgO), respectively.

Original languageEnglish
Pages (from-to)185-191
Number of pages7
JournalJournal of Crystal Growth
Issue number1-4
Publication statusPublished - 1 Mar 2004



  • A1. Residual stresses
  • A1. Texture
  • A1. X-ray diffraction
  • A2. Metalorganic chemical vapor deposition
  • B1. La Sr MnO (LSMO)
  • B1. Manganites

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Inorganic Chemistry
  • Materials Chemistry

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