Wafer level self-packaged infrared microsensors

Aamer Mahmoud, Aasutosh Dave, Zeynep Çelik-Butler, Donald P. Butler

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)

Abstract

One common requirement of microbolometers fabricated on both rigid and flexible substrates is the need for vacuum packaging to eliminate the thermal conductivity of air and achieve high performance. However, vacuum packaging of microbolometers is expensive and is a limiting factor in achieving truly low-cost uncooled infrared detection. Vacuum packing of microbolometers on flexible substrates requires a novel approach unless flexibility is to be sacrificed. This paper explores the vacuum packaging of microbolometers through self-packaging. In this case, the micromachined encapsulation in a vacuum cavity is investigated through computer simulation of microbolometers in flexible polyimide films and through the encapsulation of microbolometers on rigid Si substrates with a Si3N4 shell. In this manner, self packaged uncooled microbolometers were fabricated on a Si wafer with semiconducting yttrium barium copper oxide (YBCO) as the infrared sensing material. The self-packaged structure is designed such that it can be covered with a superstrate, yielding low stress in the flexible skin sensors and better detection figures of merit. The devices have demonstrated voltage responsivities over 103 V/W, detectivities above 106 cm Hz1/2/W and temperature coefficient of resistance around -3.3% K -1. Computer simulations using CoventorWare® and MEMulator® have been used to determine suitable materials for the process, the optimum design of a vacuum element and a streamlined process flow.

Original languageEnglish
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsB.F. Andresen, G.F. Fulop
Pages473-482
Number of pages10
Volume5406
EditionPART 2
DOIs
Publication statusPublished - 2004
Externally publishedYes
EventInfrared Technology and Applications XXX - Orlando, FL, United States
Duration: 14 Apr 200415 Dec 2004

Other

OtherInfrared Technology and Applications XXX
CountryUnited States
CityOrlando, FL
Period14/4/0415/12/04

Fingerprint

Microsensors
wafers
Vacuum
Infrared radiation
packaging
vacuum
Packaging
Encapsulation
Yttrium barium copper oxides
Substrates
computerized simulation
barium oxides
Computer simulation
copper oxides
yttrium
polyimides
Polyimides
figure of merit
Thermal conductivity
Skin

Keywords

  • Distributed sensors
  • Smart skin
  • Uncooled IR detection
  • Wafer-level packaging

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Mahmoud, A., Dave, A., Çelik-Butler, Z., & Butler, D. P. (2004). Wafer level self-packaged infrared microsensors. In B. F. Andresen, & G. F. Fulop (Eds.), Proceedings of SPIE - The International Society for Optical Engineering (PART 2 ed., Vol. 5406, pp. 473-482) https://doi.org/10.1117/12.542680

Wafer level self-packaged infrared microsensors. / Mahmoud, Aamer; Dave, Aasutosh; Çelik-Butler, Zeynep; Butler, Donald P.

Proceedings of SPIE - The International Society for Optical Engineering. ed. / B.F. Andresen; G.F. Fulop. Vol. 5406 PART 2. ed. 2004. p. 473-482.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Mahmoud, A, Dave, A, Çelik-Butler, Z & Butler, DP 2004, Wafer level self-packaged infrared microsensors. in BF Andresen & GF Fulop (eds), Proceedings of SPIE - The International Society for Optical Engineering. PART 2 edn, vol. 5406, pp. 473-482, Infrared Technology and Applications XXX, Orlando, FL, United States, 14/4/04. https://doi.org/10.1117/12.542680
Mahmoud A, Dave A, Çelik-Butler Z, Butler DP. Wafer level self-packaged infrared microsensors. In Andresen BF, Fulop GF, editors, Proceedings of SPIE - The International Society for Optical Engineering. PART 2 ed. Vol. 5406. 2004. p. 473-482 https://doi.org/10.1117/12.542680
Mahmoud, Aamer ; Dave, Aasutosh ; Çelik-Butler, Zeynep ; Butler, Donald P. / Wafer level self-packaged infrared microsensors. Proceedings of SPIE - The International Society for Optical Engineering. editor / B.F. Andresen ; G.F. Fulop. Vol. 5406 PART 2. ed. 2004. pp. 473-482
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