Variation of mean emitter depth with direction in core photoelectron emission from single crystals

S. D. Ruebush, R. X. Ynzunza, S. Thevuthasan, A. P. Kaduwela, M. A. Van Hove, C. S. Fadley

Research output: Contribution to journalArticle

11 Citations (Scopus)


We have theoretically studied the variation of mean emitter depths with direction for core photoelectron emission from single crystals, including the effects of both isotropic inelastic scattering and single and multiple elastic scattering. Our calculations were carried out for emission in the 1 keV energy range on both simple chains of atoms embedded in an isotropic inelastic medium and on larger atomic clusters that should more realistically simulate emission from a semi-infinite single-crystal substrate or epitaxial overlayer. The mean emitter depth is found to vary by as much as ±30% with direction. It is lowest just adjacent to low-index chains of atoms because of destructive interferences in photoelectron diffraction. It is highest along low-index directions due to forward scattering, in spite of well-known reductions in intensity along such directions due to multiple-scattering defocusing effects. These variations of mean emission depth, due to photoelectron diffraction effects (as well as analogous Auger diffraction effects), should be taken into account in the quantitative characterization of surfaces, surface concentration profiles, and epitaxial surface structures using photoelectrons and Auger electrons.

Original languageEnglish
Pages (from-to)302-310
Number of pages9
JournalSurface Science
Issue number3
Publication statusPublished - 1 May 1995
Externally publishedYes



  • Electron-solid interactions, scattering, diffraction
  • Low-index single-crystal surfaces
  • Nickel
  • Photoelectron diffraction
  • Photoelectron emission
  • Silicon
  • X-ray photoelectron spectroscopy

ASJC Scopus subject areas

  • Materials Chemistry
  • Surfaces, Coatings and Films
  • Condensed Matter Physics
  • Surfaces and Interfaces

Cite this

Ruebush, S. D., Ynzunza, R. X., Thevuthasan, S., Kaduwela, A. P., Van Hove, M. A., & Fadley, C. S. (1995). Variation of mean emitter depth with direction in core photoelectron emission from single crystals. Surface Science, 328(3), 302-310.