Variation of mean emitter depth with direction in core photoelectron emission from single crystals

S. D. Ruebush, R. X. Ynzunza, S. Thevuthasan, A. P. Kaduwela, M. A. Van Hove, C. S. Fadley

Research output: Contribution to journalArticle

11 Citations (Scopus)

Abstract

We have theoretically studied the variation of mean emitter depths with direction for core photoelectron emission from single crystals, including the effects of both isotropic inelastic scattering and single and multiple elastic scattering. Our calculations were carried out for emission in the 1 keV energy range on both simple chains of atoms embedded in an isotropic inelastic medium and on larger atomic clusters that should more realistically simulate emission from a semi-infinite single-crystal substrate or epitaxial overlayer. The mean emitter depth is found to vary by as much as ±30% with direction. It is lowest just adjacent to low-index chains of atoms because of destructive interferences in photoelectron diffraction. It is highest along low-index directions due to forward scattering, in spite of well-known reductions in intensity along such directions due to multiple-scattering defocusing effects. These variations of mean emission depth, due to photoelectron diffraction effects (as well as analogous Auger diffraction effects), should be taken into account in the quantitative characterization of surfaces, surface concentration profiles, and epitaxial surface structures using photoelectrons and Auger electrons.

Original languageEnglish
Pages (from-to)302-310
Number of pages9
JournalSurface Science
Volume328
Issue number3
DOIs
Publication statusPublished - 1 May 1995
Externally publishedYes

Fingerprint

Photoelectrons
emitters
photoelectrons
Single crystals
Diffraction
Multiple scattering
single crystals
diffraction
Forward scattering
Atoms
atomic clusters
Inelastic scattering
Elastic scattering
defocusing
forward scattering
Surface structure
atoms
elastic scattering
inelastic scattering
interference

Keywords

  • Electron-solid interactions, scattering, diffraction
  • Low-index single-crystal surfaces
  • Nickel
  • Photoelectron diffraction
  • Photoelectron emission
  • Silicon
  • X-ray photoelectron spectroscopy

ASJC Scopus subject areas

  • Materials Chemistry
  • Surfaces, Coatings and Films
  • Condensed Matter Physics
  • Surfaces and Interfaces

Cite this

Ruebush, S. D., Ynzunza, R. X., Thevuthasan, S., Kaduwela, A. P., Van Hove, M. A., & Fadley, C. S. (1995). Variation of mean emitter depth with direction in core photoelectron emission from single crystals. Surface Science, 328(3), 302-310. https://doi.org/10.1016/0039-6028(95)00048-8

Variation of mean emitter depth with direction in core photoelectron emission from single crystals. / Ruebush, S. D.; Ynzunza, R. X.; Thevuthasan, S.; Kaduwela, A. P.; Van Hove, M. A.; Fadley, C. S.

In: Surface Science, Vol. 328, No. 3, 01.05.1995, p. 302-310.

Research output: Contribution to journalArticle

Ruebush, SD, Ynzunza, RX, Thevuthasan, S, Kaduwela, AP, Van Hove, MA & Fadley, CS 1995, 'Variation of mean emitter depth with direction in core photoelectron emission from single crystals', Surface Science, vol. 328, no. 3, pp. 302-310. https://doi.org/10.1016/0039-6028(95)00048-8
Ruebush SD, Ynzunza RX, Thevuthasan S, Kaduwela AP, Van Hove MA, Fadley CS. Variation of mean emitter depth with direction in core photoelectron emission from single crystals. Surface Science. 1995 May 1;328(3):302-310. https://doi.org/10.1016/0039-6028(95)00048-8
Ruebush, S. D. ; Ynzunza, R. X. ; Thevuthasan, S. ; Kaduwela, A. P. ; Van Hove, M. A. ; Fadley, C. S. / Variation of mean emitter depth with direction in core photoelectron emission from single crystals. In: Surface Science. 1995 ; Vol. 328, No. 3. pp. 302-310.
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