Tracing SRAM separatrix for dynamic noise margin analysis under device mismatch

Garng Morton Huang, Wei Dong, Yenpo Ho, Peng Li

Research output: Chapter in Book/Report/Conference proceedingConference contribution

30 Citations (Scopus)

Abstract

SRAM-based memory arrays designed in deeply scaled technologies become increasingly susceptible to soft errors. A full account of SRAM cell stability requires dynamic noise margin models that take into account the temporal behavior of noise injection mechanism. One critical component of dynamic noise margin analysis is the determination of stability boundary, or the separatrix. Different from the unrealistic assumption made in prior work, we show that the separatrix is subject to signi.cant perturbation due to device mismatch and hence must be carefully accounted for in noise margin analysis. More importantly, by applying a rigorous nonlinear system theory, we present an efficient separatrix tracing technique that can accurately determine the separatrix via fast transistor-level transient simulation. The presented technique is shown to be up to thousands times faster than a brute-force approach.

Original languageEnglish
Title of host publication2007 IEEE International Behavioral Modeling and Simulation Workshop, BMAS
Pages6-10
Number of pages5
DOIs
Publication statusPublished - 1 Dec 2007
Externally publishedYes
Event2007 IEEE International Behavioral Modeling and Simulation Workshop, BMAS - San Jose, CA, United States
Duration: 20 Sep 200721 Sep 2007

Other

Other2007 IEEE International Behavioral Modeling and Simulation Workshop, BMAS
CountryUnited States
CitySan Jose, CA
Period20/9/0721/9/07

Fingerprint

Static random access storage
System theory
Nonlinear systems
Transistors
Data storage equipment

ASJC Scopus subject areas

  • Computational Theory and Mathematics
  • Computer Science Applications
  • Computational Mechanics

Cite this

Huang, G. M., Dong, W., Ho, Y., & Li, P. (2007). Tracing SRAM separatrix for dynamic noise margin analysis under device mismatch. In 2007 IEEE International Behavioral Modeling and Simulation Workshop, BMAS (pp. 6-10). [4437516] https://doi.org/10.1109/BMAS.2007.4437516

Tracing SRAM separatrix for dynamic noise margin analysis under device mismatch. / Huang, Garng Morton; Dong, Wei; Ho, Yenpo; Li, Peng.

2007 IEEE International Behavioral Modeling and Simulation Workshop, BMAS. 2007. p. 6-10 4437516.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Huang, GM, Dong, W, Ho, Y & Li, P 2007, Tracing SRAM separatrix for dynamic noise margin analysis under device mismatch. in 2007 IEEE International Behavioral Modeling and Simulation Workshop, BMAS., 4437516, pp. 6-10, 2007 IEEE International Behavioral Modeling and Simulation Workshop, BMAS, San Jose, CA, United States, 20/9/07. https://doi.org/10.1109/BMAS.2007.4437516
Huang GM, Dong W, Ho Y, Li P. Tracing SRAM separatrix for dynamic noise margin analysis under device mismatch. In 2007 IEEE International Behavioral Modeling and Simulation Workshop, BMAS. 2007. p. 6-10. 4437516 https://doi.org/10.1109/BMAS.2007.4437516
Huang, Garng Morton ; Dong, Wei ; Ho, Yenpo ; Li, Peng. / Tracing SRAM separatrix for dynamic noise margin analysis under device mismatch. 2007 IEEE International Behavioral Modeling and Simulation Workshop, BMAS. 2007. pp. 6-10
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