The effect of Se doping on spectroscopic and electrical properties of GeTe

E. M. Vinod, K. S. Sangunni

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12 Citations (Scopus)

Abstract

Selenium doped thin films of GeTe alloys were investigated for their structural modifications by X-ray Diffraction, Fourier Transform Infrared Spectroscopy, X-ray photoelectron Spectroscopy (XPS) and Raman Spectroscopy. The band gap increase from 0.69 to 1.10 eV with increasing Se addition signifies the possibility of band gap tuning in the material. Disorder decreases, band widens and conductivity saturates about 0.20 at.% of Se addition. Structural changes are explained by the bond theory of solids. The as-deposited films are amorphous and 0.50 at.% Se alloy forms a homogeneous amorphous phase with a mixture of GeSe and TeSe bonds. The XPS core level spectra and Raman spectra investigation clearly indicate the formation of GeSe, GeTe2 and TeSe bonds with Se addition. Crystallization temperature is found to be increasing with Se and the 0.10 at.% Se alloy is found to have a higher resistance contrast compared to other Se concentration alloys. Up to 0.10 at.% of Se addition can enhance GeTe phase change memory properties.

Original languageEnglish
Pages (from-to)569-574
Number of pages6
JournalThin Solid Films
Volume550
DOIs
Publication statusPublished - 1 Jan 2014

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Keywords

  • Phase change memory
  • Raman spectroscopy
  • XPS
  • XRD

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Metals and Alloys
  • Materials Chemistry

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