Temperature dependent fatigue in ferroelectric PZT thin films

E. N. Paton, S. A. Mansour, A. Bement

Research output: Contribution to conferencePaper

5 Citations (Scopus)

Abstract

The rate of electrical fatigue at different temperatures was measured for lead zirconate titanate capacitors with the composition Pb(Zr.60Ti.40)O3. Results showed that a temperature rise contributes to an increasing rate of logarithmic decay in the fatigue profile. We distinguish two thermally dependent stages during fatigue; each plotted as separate Arrhenius relationships. The first stage has an experimentally measured activation energy of 0.22 eV while the second stage has a measured value of 0.042 eV. The physical basis for these activation energies has not been identified due to the complexity of interactions occurring during the switching reversals. Even so, the measured values give some indication of the types of defects and the mechanisms responsible in each stage.

Original languageEnglish
Pages467-470
Number of pages4
Publication statusPublished - 1 Dec 1996
EventProceedings of the 1996 10th IEEE International Symposium on Applications of Ferroelectrics, ISAF. Part 1 (of 2) - East Brunswick, NJ, USA
Duration: 18 Aug 199621 Aug 1996

Other

OtherProceedings of the 1996 10th IEEE International Symposium on Applications of Ferroelectrics, ISAF. Part 1 (of 2)
CityEast Brunswick, NJ, USA
Period18/8/9621/8/96

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ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

Cite this

Paton, E. N., Mansour, S. A., & Bement, A. (1996). Temperature dependent fatigue in ferroelectric PZT thin films. 467-470. Paper presented at Proceedings of the 1996 10th IEEE International Symposium on Applications of Ferroelectrics, ISAF. Part 1 (of 2), East Brunswick, NJ, USA, .