Systematic bias compensation for a moiré fringe projection system

D. Purcell, Ayman Samara, A. Davies, F. Farahi

Research output: Contribution to journalArticle

Abstract

Moiré fringe projection techniques are gaining popularity due to their non-contact nature and high accuracy in measuring the surface shape of many objects. The fringe patterns seen when using these instruments are similar to the patterns seen in traditional interferometry but differ in that the spacing between consecutive fringes in traditional interferometry is constant and equal to the wavelength of the source. In moiré fringe projection, the spacing (equivalent wavelength) between consecutive fringes may not be constant over the field of view and it depends on the geometry (divergent or parallel) of the set-up. This variation in the equivalent wavelength X causes the surface height measurements to be inaccurate. This paper looks at the aberrations that are caused by this varying equivalent wavelength and a calibration process to determine the equivalent wavelength map.

Original languageEnglish
Article number587909
Pages (from-to)1-8
Number of pages8
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume5879
DOIs
Publication statusPublished - 2005
Externally publishedYes

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Keywords

  • Calibration Process
  • Projection Moiré

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

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