Systematic bias compensation for a moiré fringe projection system

D. Purcell, Ayman Samara, A. Davies, F. Farahi

Research output: Contribution to journalArticle

Abstract

Moiré fringe projection techniques are gaining popularity due to their non-contact nature and high accuracy in measuring the surface shape of many objects. The fringe patterns seen when using these instruments are similar to the patterns seen in traditional interferometry but differ in that the spacing between consecutive fringes in traditional interferometry is constant and equal to the wavelength of the source. In moiré fringe projection, the spacing (equivalent wavelength) between consecutive fringes may not be constant over the field of view and it depends on the geometry (divergent or parallel) of the set-up. This variation in the equivalent wavelength X causes the surface height measurements to be inaccurate. This paper looks at the aberrations that are caused by this varying equivalent wavelength and a calibration process to determine the equivalent wavelength map.

Original languageEnglish
Article number587909
Pages (from-to)1-8
Number of pages8
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume5879
DOIs
Publication statusPublished - 2005
Externally publishedYes

Fingerprint

Fringe Projection
Projection systems
projection
Wavelength
wavelengths
Interferometry
Spacing
Consecutive
interferometry
spacing
Surface measurement
Non-contact
Inaccurate
Aberrations
Aberration
Field of View
field of view
aberration
High Accuracy
Calibration

Keywords

  • Calibration Process
  • Projection Moiré

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Systematic bias compensation for a moiré fringe projection system. / Purcell, D.; Samara, Ayman; Davies, A.; Farahi, F.

In: Proceedings of SPIE - The International Society for Optical Engineering, Vol. 5879, 587909, 2005, p. 1-8.

Research output: Contribution to journalArticle

@article{904f9ba9e20d47469c883eee9a28cac8,
title = "Systematic bias compensation for a moir{\'e} fringe projection system",
abstract = "Moir{\'e} fringe projection techniques are gaining popularity due to their non-contact nature and high accuracy in measuring the surface shape of many objects. The fringe patterns seen when using these instruments are similar to the patterns seen in traditional interferometry but differ in that the spacing between consecutive fringes in traditional interferometry is constant and equal to the wavelength of the source. In moir{\'e} fringe projection, the spacing (equivalent wavelength) between consecutive fringes may not be constant over the field of view and it depends on the geometry (divergent or parallel) of the set-up. This variation in the equivalent wavelength X causes the surface height measurements to be inaccurate. This paper looks at the aberrations that are caused by this varying equivalent wavelength and a calibration process to determine the equivalent wavelength map.",
keywords = "Calibration Process, Projection Moir{\'e}",
author = "D. Purcell and Ayman Samara and A. Davies and F. Farahi",
year = "2005",
doi = "10.1117/12.614564",
language = "English",
volume = "5879",
pages = "1--8",
journal = "Proceedings of SPIE - The International Society for Optical Engineering",
issn = "0277-786X",
publisher = "SPIE",

}

TY - JOUR

T1 - Systematic bias compensation for a moiré fringe projection system

AU - Purcell, D.

AU - Samara, Ayman

AU - Davies, A.

AU - Farahi, F.

PY - 2005

Y1 - 2005

N2 - Moiré fringe projection techniques are gaining popularity due to their non-contact nature and high accuracy in measuring the surface shape of many objects. The fringe patterns seen when using these instruments are similar to the patterns seen in traditional interferometry but differ in that the spacing between consecutive fringes in traditional interferometry is constant and equal to the wavelength of the source. In moiré fringe projection, the spacing (equivalent wavelength) between consecutive fringes may not be constant over the field of view and it depends on the geometry (divergent or parallel) of the set-up. This variation in the equivalent wavelength X causes the surface height measurements to be inaccurate. This paper looks at the aberrations that are caused by this varying equivalent wavelength and a calibration process to determine the equivalent wavelength map.

AB - Moiré fringe projection techniques are gaining popularity due to their non-contact nature and high accuracy in measuring the surface shape of many objects. The fringe patterns seen when using these instruments are similar to the patterns seen in traditional interferometry but differ in that the spacing between consecutive fringes in traditional interferometry is constant and equal to the wavelength of the source. In moiré fringe projection, the spacing (equivalent wavelength) between consecutive fringes may not be constant over the field of view and it depends on the geometry (divergent or parallel) of the set-up. This variation in the equivalent wavelength X causes the surface height measurements to be inaccurate. This paper looks at the aberrations that are caused by this varying equivalent wavelength and a calibration process to determine the equivalent wavelength map.

KW - Calibration Process

KW - Projection Moiré

UR - http://www.scopus.com/inward/record.url?scp=29244457884&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=29244457884&partnerID=8YFLogxK

U2 - 10.1117/12.614564

DO - 10.1117/12.614564

M3 - Article

VL - 5879

SP - 1

EP - 8

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

SN - 0277-786X

M1 - 587909

ER -