Synthesis and characterization of DC magnetron sputtered ZnO thin films under high working pressures

M. Hezam, Nouar Tabet, A. Mekki

Research output: Contribution to journalArticle

24 Citations (Scopus)

Abstract

ZnO thin films were deposited on glass substrates using direct current (dc) magnetron sputtering under high working pressures. A pure zinc target was used, and sputtering was carried out in an oxygen atmosphere. The working pressure was varied between 50 and 800 mTorr. XRD characterization showed that for a window of working pressures between 300 and 500 mTorr, the deposited films were polycrystalline, with strong preferential orientation of grains along the c-axis. The film deposited at 400 mTorr had the highest (002) peak with the largest estimated grain size. Outside this window, the crystallinity and c-orientation of grains are lost. The microstructure of the films was investigated by Atomic Force microscopy (AFM). Optical transparency of the films was about 85%. The films produced were highly resistive, which might provide new alternatives for the synthesis of ZnO thin films aimed for SAW devices.

Original languageEnglish
JournalThin Solid Films
Volume518
Issue number24 SUPPL.
DOIs
Publication statusPublished - 1 Oct 2010
Externally publishedYes

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Keywords

  • Grain size
  • Magnetron sputtering
  • Working pressure

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Materials Chemistry
  • Metals and Alloys
  • Surfaces, Coatings and Films
  • Surfaces and Interfaces

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