Surface and interface characterization of self-assembled copper oxide quantum dots on SrTiO 3(001) surface

S. Thevuthasan, P. Nachimuthu, Y. J. Kim, I. Lyubinetsky, A. S. Lea, V. Shutthanandan, M. H. Engelhard, D. R. Baer, D. K. Shuh, D. W. Lindle

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Abstract

    Copper oxide quantum dots (QDs) were grown in various thicknesses on different SrTiO 3(001) surfaces and were characterized using various surface and bulk sensitive techniques. The experimental growth conditions were optimized to obtain Cu 2O as the major phase in these structures. The copper oxide QDs grown on clean SrTiO 3(001) surfaces at 825 K or higher with p(O 2) of 9.0×10 -7 Torr or above contain mostly Cu(II) in contrast to those grown at 800 K with p(O 2) of ∼7.0×10 -7 Torr that contain primarily Cu(I). Furthermore, it has been established that there is a strong interaction between the SrTiO 3(001) surface and the first few monolayers of these nano structures, which induces the formation of Cu(II). However, this interaction is mitigated with increasing thickness of copper oxide QDs resulting in the exclusive formation of Cu 2O in the topmost layers. Modification of substrate surfaces using chemical treatment and/or energetic Au 2+ ion-beam irradiation affects the formation of these structures.

    Original languageEnglish
    Title of host publication2003 Nanotechnology Conference and Trade Show - Nanotech 2003
    EditorsM. Laudon, B. Romanowicz
    Pages278-281
    Number of pages4
    Publication statusPublished - 1 Dec 2003
    Event2003 Nanotechnology Conference and Trade Show - Nanotech 2003 - San Francisco, CA, United States
    Duration: 23 Feb 200327 Feb 2003

    Publication series

    Name2003 Nanotechnology Conference and Trade Show - Nanotech 2003
    Volume3

    Conference

    Conference2003 Nanotechnology Conference and Trade Show - Nanotech 2003
    CountryUnited States
    CitySan Francisco, CA
    Period23/2/0327/2/03

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    Keywords

    • Atomic Force Microscopy (AFM)
    • Characterization
    • Molecular Beam Epitaxy (MBE)
    • Near Edge X-ray Absorption Fine Structure (NEXAFS)
    • Oxide Quantum Dots
    • Synthesis
    • X-ray Photoelectron Spectroscopy (XPS)

    ASJC Scopus subject areas

    • Engineering(all)

    Cite this

    Thevuthasan, S., Nachimuthu, P., Kim, Y. J., Lyubinetsky, I., Lea, A. S., Shutthanandan, V., Engelhard, M. H., Baer, D. R., Shuh, D. K., & Lindle, D. W. (2003). Surface and interface characterization of self-assembled copper oxide quantum dots on SrTiO 3(001) surface. In M. Laudon, & B. Romanowicz (Eds.), 2003 Nanotechnology Conference and Trade Show - Nanotech 2003 (pp. 278-281). (2003 Nanotechnology Conference and Trade Show - Nanotech 2003; Vol. 3).