Structure, stability and bonding of ternary transition metal nitrides

Grigorios Matenoglou, L. E. Koutsokeras, Ch E. Lekka, G. Abadias, C. Kosmidis, G. A. Evangelakis, P. Patsalas

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40 Citations (Scopus)


Ternary transition metal nitrides have gained special attention in an effort to improve further the properties of the corresponding binary compounds. In this work, we present a comparative study of a very wide range of ternary transition metal nitrides of the form: TixMe1-xN and TaxMe1-xN (Me = Ti,Zr,Hf,Nb,Ta,Mo,W) over the whole x range (0 < x < 1) grown by Pulsed Laser Deposition (PLD) and by Dual Ion Beam Sputtering. We study the stability of the rocksalt structure in all these films experimentally and theoretically through ab-initio calculations. We investigate the validity of Vegard's rule and the effect of growth-dependent stresses to the lattice constant.

Original languageEnglish
Pages (from-to)911-914
Number of pages4
JournalSurface and Coatings Technology
Issue number6-7
Publication statusPublished - 25 Dec 2009
Externally publishedYes



  • ab initio calculations
  • Bonding
  • Stress
  • Structure
  • Ternary nitrides
  • X-Ray diffraction

ASJC Scopus subject areas

  • Chemistry(all)
  • Materials Chemistry
  • Surfaces, Coatings and Films
  • Condensed Matter Physics
  • Surfaces and Interfaces

Cite this

Matenoglou, G., Koutsokeras, L. E., Lekka, C. E., Abadias, G., Kosmidis, C., Evangelakis, G. A., & Patsalas, P. (2009). Structure, stability and bonding of ternary transition metal nitrides. Surface and Coatings Technology, 204(6-7), 911-914.