Structure, electrical and magnetic properties of thin films of La1-xMxMnO3 on Si

N. N. Mateeva, P. C. Hogan, K. H. Dahmen

Research output: Contribution to journalConference article

Abstract

Thin films of lanthanum manganates doped with Ca2+, Sr2+, Ba2+ and Pb2+ have been deposited on Si(100) substrate and their electrical and magnetic properties were discussed with respect to the composition, structure and nature of the dopant. Buffer layers of YSZ and La0.8Al0.2O3 were employed and their effect on the materials was studied. Interesting magnetotransport properties were found in some of the films, where there is a large difference between the insulator-metal transition temperature and a ferromagnetic transition temperature.

Original languageEnglish
Pages (from-to)51-56
Number of pages6
JournalMaterials Research Society Symposium - Proceedings
Volume562
Publication statusPublished - 1 Dec 1999
EventThe 1999 MRS Spring Meeting - Symposium L 'Polycrystalline Metal and Magnetic Thin Films' - San Francisco, Ca, USA
Duration: 5 Apr 19988 Apr 1998

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ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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