Structural analysis of metal-oxide nanostructures

Ahsanulhaq Qurashi, M. Faiz, Nouar Tabet

Research output: Chapter in Book/Report/Conference proceedingChapter

Abstract

Structural analysis plays the key role in understanding the relation between the preparation and morphology and intrinsic properties of metal oxide nanostructures. In this chapter structural analysis of metal oxide nanostructures by variety of fundamental techniques like X-ray diffraction pattern (XRD), Grazing incident X-ray diffraction (GIXRD), Scanning electron microscopy (SEM), field emission scanning electron microscopy (FESEM), transmission electron microscopy (TEM), atomic force microscopy (AFM), energy dispersive X-ray spectroscopy (EDX), and X-ray photoelectron spectroscopy (XPES) etc will be presented. The detailed crystal structure of In2O3 pyramids will be presented by XRD analysis. For in-situ examination, grazing incidence small angle scattering and diffraction of X-rays (GIXRD) results of ZnO nanostructures will be presented. The morphological description and the examination of the surface of the structure, which includes the analysis of their eventual structure and their size, shape distribution, cross-section from their surface to the substrate, the analysis of the surface and its inhomogenities will be attained by SEM and FESEM analysis. Detailed structural analysis with single crystalline nature of ZnO nanostructures will be presented by TEM equipped with selected area electron diffraction pattern (SAED) and high resolution transmission electron microscope (HRTEM). The surface roughness of vertically aligned ZnO nanorod arrays will be studied by atomic force microscopy (AFM). In order to know the exact chemical composition, stiochiometry and chemical bonding nature of metal-oxide nanostructures, the energy dispersive X-ray spectroscopy (EDX), and X-ray electron spectroscopy (XPES) techniques will be included.

Original languageEnglish
Title of host publicationStructural Analysis
PublisherNova Science Publishers, Inc.
Pages51-72
Number of pages22
ISBN (Electronic)9781617284816
ISBN (Print)9781616689872
Publication statusPublished - 1 Jan 2010

Fingerprint

Structural Analysis
Nanostructures
X-ray Spectroscopy
Oxides
Scanning Electron Microscopy
X-ray Diffraction
Metals
Field Emission
Atomic Force Microscopy
Transmission Electron Microscopy
Electron
Diffraction
Nanorods
Pattern Analysis
Pyramid
Crystal Structure
Surface Roughness
Energy
Microscope
Spectroscopy

ASJC Scopus subject areas

  • Mathematics(all)

Cite this

Qurashi, A., Faiz, M., & Tabet, N. (2010). Structural analysis of metal-oxide nanostructures. In Structural Analysis (pp. 51-72). Nova Science Publishers, Inc..

Structural analysis of metal-oxide nanostructures. / Qurashi, Ahsanulhaq; Faiz, M.; Tabet, Nouar.

Structural Analysis. Nova Science Publishers, Inc., 2010. p. 51-72.

Research output: Chapter in Book/Report/Conference proceedingChapter

Qurashi, A, Faiz, M & Tabet, N 2010, Structural analysis of metal-oxide nanostructures. in Structural Analysis. Nova Science Publishers, Inc., pp. 51-72.
Qurashi A, Faiz M, Tabet N. Structural analysis of metal-oxide nanostructures. In Structural Analysis. Nova Science Publishers, Inc. 2010. p. 51-72
Qurashi, Ahsanulhaq ; Faiz, M. ; Tabet, Nouar. / Structural analysis of metal-oxide nanostructures. Structural Analysis. Nova Science Publishers, Inc., 2010. pp. 51-72
@inbook{5bda75d720fa4fd89499bab5811a1962,
title = "Structural analysis of metal-oxide nanostructures",
abstract = "Structural analysis plays the key role in understanding the relation between the preparation and morphology and intrinsic properties of metal oxide nanostructures. In this chapter structural analysis of metal oxide nanostructures by variety of fundamental techniques like X-ray diffraction pattern (XRD), Grazing incident X-ray diffraction (GIXRD), Scanning electron microscopy (SEM), field emission scanning electron microscopy (FESEM), transmission electron microscopy (TEM), atomic force microscopy (AFM), energy dispersive X-ray spectroscopy (EDX), and X-ray photoelectron spectroscopy (XPES) etc will be presented. The detailed crystal structure of In2O3 pyramids will be presented by XRD analysis. For in-situ examination, grazing incidence small angle scattering and diffraction of X-rays (GIXRD) results of ZnO nanostructures will be presented. The morphological description and the examination of the surface of the structure, which includes the analysis of their eventual structure and their size, shape distribution, cross-section from their surface to the substrate, the analysis of the surface and its inhomogenities will be attained by SEM and FESEM analysis. Detailed structural analysis with single crystalline nature of ZnO nanostructures will be presented by TEM equipped with selected area electron diffraction pattern (SAED) and high resolution transmission electron microscope (HRTEM). The surface roughness of vertically aligned ZnO nanorod arrays will be studied by atomic force microscopy (AFM). In order to know the exact chemical composition, stiochiometry and chemical bonding nature of metal-oxide nanostructures, the energy dispersive X-ray spectroscopy (EDX), and X-ray electron spectroscopy (XPES) techniques will be included.",
author = "Ahsanulhaq Qurashi and M. Faiz and Nouar Tabet",
year = "2010",
month = "1",
day = "1",
language = "English",
isbn = "9781616689872",
pages = "51--72",
booktitle = "Structural Analysis",
publisher = "Nova Science Publishers, Inc.",

}

TY - CHAP

T1 - Structural analysis of metal-oxide nanostructures

AU - Qurashi, Ahsanulhaq

AU - Faiz, M.

AU - Tabet, Nouar

PY - 2010/1/1

Y1 - 2010/1/1

N2 - Structural analysis plays the key role in understanding the relation between the preparation and morphology and intrinsic properties of metal oxide nanostructures. In this chapter structural analysis of metal oxide nanostructures by variety of fundamental techniques like X-ray diffraction pattern (XRD), Grazing incident X-ray diffraction (GIXRD), Scanning electron microscopy (SEM), field emission scanning electron microscopy (FESEM), transmission electron microscopy (TEM), atomic force microscopy (AFM), energy dispersive X-ray spectroscopy (EDX), and X-ray photoelectron spectroscopy (XPES) etc will be presented. The detailed crystal structure of In2O3 pyramids will be presented by XRD analysis. For in-situ examination, grazing incidence small angle scattering and diffraction of X-rays (GIXRD) results of ZnO nanostructures will be presented. The morphological description and the examination of the surface of the structure, which includes the analysis of their eventual structure and their size, shape distribution, cross-section from their surface to the substrate, the analysis of the surface and its inhomogenities will be attained by SEM and FESEM analysis. Detailed structural analysis with single crystalline nature of ZnO nanostructures will be presented by TEM equipped with selected area electron diffraction pattern (SAED) and high resolution transmission electron microscope (HRTEM). The surface roughness of vertically aligned ZnO nanorod arrays will be studied by atomic force microscopy (AFM). In order to know the exact chemical composition, stiochiometry and chemical bonding nature of metal-oxide nanostructures, the energy dispersive X-ray spectroscopy (EDX), and X-ray electron spectroscopy (XPES) techniques will be included.

AB - Structural analysis plays the key role in understanding the relation between the preparation and morphology and intrinsic properties of metal oxide nanostructures. In this chapter structural analysis of metal oxide nanostructures by variety of fundamental techniques like X-ray diffraction pattern (XRD), Grazing incident X-ray diffraction (GIXRD), Scanning electron microscopy (SEM), field emission scanning electron microscopy (FESEM), transmission electron microscopy (TEM), atomic force microscopy (AFM), energy dispersive X-ray spectroscopy (EDX), and X-ray photoelectron spectroscopy (XPES) etc will be presented. The detailed crystal structure of In2O3 pyramids will be presented by XRD analysis. For in-situ examination, grazing incidence small angle scattering and diffraction of X-rays (GIXRD) results of ZnO nanostructures will be presented. The morphological description and the examination of the surface of the structure, which includes the analysis of their eventual structure and their size, shape distribution, cross-section from their surface to the substrate, the analysis of the surface and its inhomogenities will be attained by SEM and FESEM analysis. Detailed structural analysis with single crystalline nature of ZnO nanostructures will be presented by TEM equipped with selected area electron diffraction pattern (SAED) and high resolution transmission electron microscope (HRTEM). The surface roughness of vertically aligned ZnO nanorod arrays will be studied by atomic force microscopy (AFM). In order to know the exact chemical composition, stiochiometry and chemical bonding nature of metal-oxide nanostructures, the energy dispersive X-ray spectroscopy (EDX), and X-ray electron spectroscopy (XPES) techniques will be included.

UR - http://www.scopus.com/inward/record.url?scp=85016808310&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85016808310&partnerID=8YFLogxK

M3 - Chapter

SN - 9781616689872

SP - 51

EP - 72

BT - Structural Analysis

PB - Nova Science Publishers, Inc.

ER -