Structural analysis plays the key role in understanding the relation between the preparation and morphology and intrinsic properties of metal oxide nanostructures. In this chapter structural analysis of metal oxide nanostructures by variety of fundamental techniques like X-ray diffraction pattern (XRD), Grazing incident X-ray diffraction (GIXRD), Scanning electron microscopy (SEM), field emission scanning electron microscopy (FESEM), transmission electron microscopy (TEM), atomic force microscopy (AFM), energy dispersive X-ray spectroscopy (EDX), and X-ray photoelectron spectroscopy (XPES) etc will be presented. The detailed crystal structure of In2O3 pyramids will be presented by XRD analysis. For in-situ examination, grazing incidence small angle scattering and diffraction of X-rays (GIXRD) results of ZnO nanostructures will be presented. The morphological description and the examination of the surface of the structure, which includes the analysis of their eventual structure and their size, shape distribution, cross-section from their surface to the substrate, the analysis of the surface and its inhomogenities will be attained by SEM and FESEM analysis. Detailed structural analysis with single crystalline nature of ZnO nanostructures will be presented by TEM equipped with selected area electron diffraction pattern (SAED) and high resolution transmission electron microscope (HRTEM). The surface roughness of vertically aligned ZnO nanorod arrays will be studied by atomic force microscopy (AFM). In order to know the exact chemical composition, stiochiometry and chemical bonding nature of metal-oxide nanostructures, the energy dispersive X-ray spectroscopy (EDX), and X-ray electron spectroscopy (XPES) techniques will be included.
|Title of host publication||Structural Analysis|
|Publisher||Nova Science Publishers, Inc.|
|Number of pages||22|
|Publication status||Published - 1 Jan 2010|
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