Abstract
In this paper, the secrecy outage performance of an underlay cognitive decode-and-forward (DF) relay network over independent and non-identical distributed (i.n.i.d) Nakagami-m fading channels is investigated, in which the secondary user transmitter communicates with the secondary destination via relays, and an eavesdropper attempts to overhear the information. We assume that the channel state information (CSI) of all links is available. The exact and asymptotic closed-form expressions for the secrecy outage probability with optimal relay selection are derived, and verified by Monte-Carlo simulations. Through asymptotic analysis, we find that the secrecy diversity order is determined by the number of relays and the fading parameters between relay and destination.
Original language | English |
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Title of host publication | 2017 IEEE International Conference on Communications, ICC 2017 |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
ISBN (Electronic) | 9781467389990 |
DOIs | |
Publication status | Published - 28 Jul 2017 |
Event | 2017 IEEE International Conference on Communications, ICC 2017 - Paris, France Duration: 21 May 2017 → 25 May 2017 |
Other
Other | 2017 IEEE International Conference on Communications, ICC 2017 |
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Country | France |
City | Paris |
Period | 21/5/17 → 25/5/17 |
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ASJC Scopus subject areas
- Computer Networks and Communications
- Electrical and Electronic Engineering
Cite this
Secrecy performance analysis with optimal DF relay selection of underlay CR networks over Nakagami-m fading channels. / Zhang, Huan; Lei, Hongjiang; Ansari, Imran Shafique; Pan, Gaofeng; Ren, Zhi; Qaraqe, Khalid.
2017 IEEE International Conference on Communications, ICC 2017. Institute of Electrical and Electronics Engineers Inc., 2017. 7996609.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
}
TY - GEN
T1 - Secrecy performance analysis with optimal DF relay selection of underlay CR networks over Nakagami-m fading channels
AU - Zhang, Huan
AU - Lei, Hongjiang
AU - Ansari, Imran Shafique
AU - Pan, Gaofeng
AU - Ren, Zhi
AU - Qaraqe, Khalid
PY - 2017/7/28
Y1 - 2017/7/28
N2 - In this paper, the secrecy outage performance of an underlay cognitive decode-and-forward (DF) relay network over independent and non-identical distributed (i.n.i.d) Nakagami-m fading channels is investigated, in which the secondary user transmitter communicates with the secondary destination via relays, and an eavesdropper attempts to overhear the information. We assume that the channel state information (CSI) of all links is available. The exact and asymptotic closed-form expressions for the secrecy outage probability with optimal relay selection are derived, and verified by Monte-Carlo simulations. Through asymptotic analysis, we find that the secrecy diversity order is determined by the number of relays and the fading parameters between relay and destination.
AB - In this paper, the secrecy outage performance of an underlay cognitive decode-and-forward (DF) relay network over independent and non-identical distributed (i.n.i.d) Nakagami-m fading channels is investigated, in which the secondary user transmitter communicates with the secondary destination via relays, and an eavesdropper attempts to overhear the information. We assume that the channel state information (CSI) of all links is available. The exact and asymptotic closed-form expressions for the secrecy outage probability with optimal relay selection are derived, and verified by Monte-Carlo simulations. Through asymptotic analysis, we find that the secrecy diversity order is determined by the number of relays and the fading parameters between relay and destination.
UR - http://www.scopus.com/inward/record.url?scp=85028344750&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85028344750&partnerID=8YFLogxK
U2 - 10.1109/ICC.2017.7996609
DO - 10.1109/ICC.2017.7996609
M3 - Conference contribution
AN - SCOPUS:85028344750
BT - 2017 IEEE International Conference on Communications, ICC 2017
PB - Institute of Electrical and Electronics Engineers Inc.
ER -