Reproducible tip fabrication and cleaning for UHV STM

Z. Q. Yu, C. M. Wang, Y. Du, S. Thevuthasan, I. Lyubinetsky

Research output: Contribution to journalArticle

41 Citations (Scopus)

Abstract

Several technical modifications related to the fabrication and ultra-high vacuum (UHV) treatments of the scanning tunneling microscope (STM) tips have been implemented to improve a reliability of the tip preparation for high-resolution STM. Widely used electrochemical etching drop-off technique has been further refined to enable a reproducible fabrication of the tips with a radius ≤3 nm. For tip cleaning by a controllable UHV annealing, simple and flexible setup has been developed. Proper W tip preparation has been demonstrated via an imaging of the TiO2 (1 1 0) surface atomic structure.

Original languageEnglish
Pages (from-to)873-877
Number of pages5
JournalUltramicroscopy
Volume108
Issue number9
DOIs
Publication statusPublished - Aug 2008
Externally publishedYes

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Keywords

  • Scanning tunneling microscopy (STM)
  • Tip scanning instrument design and characterization

ASJC Scopus subject areas

  • Materials Science(all)
  • Instrumentation

Cite this

Yu, Z. Q., Wang, C. M., Du, Y., Thevuthasan, S., & Lyubinetsky, I. (2008). Reproducible tip fabrication and cleaning for UHV STM. Ultramicroscopy, 108(9), 873-877. https://doi.org/10.1016/j.ultramic.2008.02.010