Reproducible tip fabrication and cleaning for UHV STM

Z. Q. Yu, C. M. Wang, Y. Du, S. Thevuthasan, I. Lyubinetsky

Research output: Contribution to journalArticle

40 Citations (Scopus)

Abstract

Several technical modifications related to the fabrication and ultra-high vacuum (UHV) treatments of the scanning tunneling microscope (STM) tips have been implemented to improve a reliability of the tip preparation for high-resolution STM. Widely used electrochemical etching drop-off technique has been further refined to enable a reproducible fabrication of the tips with a radius ≤3 nm. For tip cleaning by a controllable UHV annealing, simple and flexible setup has been developed. Proper W tip preparation has been demonstrated via an imaging of the TiO2 (1 1 0) surface atomic structure.

Original languageEnglish
Pages (from-to)873-877
Number of pages5
JournalUltramicroscopy
Volume108
Issue number9
DOIs
Publication statusPublished - Aug 2008
Externally publishedYes

Fingerprint

Ultrahigh vacuum
cleaning
ultrahigh vacuum
Cleaning
Microscopes
microscopes
Scanning
Electrochemical etching
Fabrication
fabrication
scanning
Annealing
Imaging techniques
preparation
atomic structure
etching
annealing
radii
high resolution

Keywords

  • Scanning tunneling microscopy (STM)
  • Tip scanning instrument design and characterization

ASJC Scopus subject areas

  • Materials Science(all)
  • Instrumentation

Cite this

Yu, Z. Q., Wang, C. M., Du, Y., Thevuthasan, S., & Lyubinetsky, I. (2008). Reproducible tip fabrication and cleaning for UHV STM. Ultramicroscopy, 108(9), 873-877. https://doi.org/10.1016/j.ultramic.2008.02.010

Reproducible tip fabrication and cleaning for UHV STM. / Yu, Z. Q.; Wang, C. M.; Du, Y.; Thevuthasan, S.; Lyubinetsky, I.

In: Ultramicroscopy, Vol. 108, No. 9, 08.2008, p. 873-877.

Research output: Contribution to journalArticle

Yu, ZQ, Wang, CM, Du, Y, Thevuthasan, S & Lyubinetsky, I 2008, 'Reproducible tip fabrication and cleaning for UHV STM', Ultramicroscopy, vol. 108, no. 9, pp. 873-877. https://doi.org/10.1016/j.ultramic.2008.02.010
Yu ZQ, Wang CM, Du Y, Thevuthasan S, Lyubinetsky I. Reproducible tip fabrication and cleaning for UHV STM. Ultramicroscopy. 2008 Aug;108(9):873-877. https://doi.org/10.1016/j.ultramic.2008.02.010
Yu, Z. Q. ; Wang, C. M. ; Du, Y. ; Thevuthasan, S. ; Lyubinetsky, I. / Reproducible tip fabrication and cleaning for UHV STM. In: Ultramicroscopy. 2008 ; Vol. 108, No. 9. pp. 873-877.
@article{5bf8ac200d3b4c3280534cc1551a0ba0,
title = "Reproducible tip fabrication and cleaning for UHV STM",
abstract = "Several technical modifications related to the fabrication and ultra-high vacuum (UHV) treatments of the scanning tunneling microscope (STM) tips have been implemented to improve a reliability of the tip preparation for high-resolution STM. Widely used electrochemical etching drop-off technique has been further refined to enable a reproducible fabrication of the tips with a radius ≤3 nm. For tip cleaning by a controllable UHV annealing, simple and flexible setup has been developed. Proper W tip preparation has been demonstrated via an imaging of the TiO2 (1 1 0) surface atomic structure.",
keywords = "Scanning tunneling microscopy (STM), Tip scanning instrument design and characterization",
author = "Yu, {Z. Q.} and Wang, {C. M.} and Y. Du and S. Thevuthasan and I. Lyubinetsky",
year = "2008",
month = "8",
doi = "10.1016/j.ultramic.2008.02.010",
language = "English",
volume = "108",
pages = "873--877",
journal = "Ultramicroscopy",
issn = "0304-3991",
publisher = "Elsevier",
number = "9",

}

TY - JOUR

T1 - Reproducible tip fabrication and cleaning for UHV STM

AU - Yu, Z. Q.

AU - Wang, C. M.

AU - Du, Y.

AU - Thevuthasan, S.

AU - Lyubinetsky, I.

PY - 2008/8

Y1 - 2008/8

N2 - Several technical modifications related to the fabrication and ultra-high vacuum (UHV) treatments of the scanning tunneling microscope (STM) tips have been implemented to improve a reliability of the tip preparation for high-resolution STM. Widely used electrochemical etching drop-off technique has been further refined to enable a reproducible fabrication of the tips with a radius ≤3 nm. For tip cleaning by a controllable UHV annealing, simple and flexible setup has been developed. Proper W tip preparation has been demonstrated via an imaging of the TiO2 (1 1 0) surface atomic structure.

AB - Several technical modifications related to the fabrication and ultra-high vacuum (UHV) treatments of the scanning tunneling microscope (STM) tips have been implemented to improve a reliability of the tip preparation for high-resolution STM. Widely used electrochemical etching drop-off technique has been further refined to enable a reproducible fabrication of the tips with a radius ≤3 nm. For tip cleaning by a controllable UHV annealing, simple and flexible setup has been developed. Proper W tip preparation has been demonstrated via an imaging of the TiO2 (1 1 0) surface atomic structure.

KW - Scanning tunneling microscopy (STM)

KW - Tip scanning instrument design and characterization

UR - http://www.scopus.com/inward/record.url?scp=48149086253&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=48149086253&partnerID=8YFLogxK

U2 - 10.1016/j.ultramic.2008.02.010

DO - 10.1016/j.ultramic.2008.02.010

M3 - Article

VL - 108

SP - 873

EP - 877

JO - Ultramicroscopy

JF - Ultramicroscopy

SN - 0304-3991

IS - 9

ER -