Several technical modifications related to the fabrication and ultra-high vacuum (UHV) treatments of the scanning tunneling microscope (STM) tips have been implemented to improve a reliability of the tip preparation for high-resolution STM. Widely used electrochemical etching drop-off technique has been further refined to enable a reproducible fabrication of the tips with a radius ≤3 nm. For tip cleaning by a controllable UHV annealing, simple and flexible setup has been developed. Proper W tip preparation has been demonstrated via an imaging of the TiO2 (1 1 0) surface atomic structure.
- Scanning tunneling microscopy (STM)
- Tip scanning instrument design and characterization
ASJC Scopus subject areas
- Materials Science(all)