Reliability of candidate photovoltaic module-integrated-inverter topologies

Souhib Harb, Robert Balog

Research output: Chapter in Book/Report/Conference proceedingConference contribution

20 Citations (Scopus)

Abstract

This paper examines the reliability of candidate topologies for a PV module-integrated inverter (MII). A new approach to calculate the mean time between failure (MTBF) using the MIL-HDBK-217 stress factor method is proposed. The new approach takes in consideration the usage model of the inverter, the statistical distribution of expected operating temperature and power processed, rather than a single (typically worst-case) operating point. The technique is applied to the systematic reliability comparative study for six different inverter topologies. This study shows the impact of each component on the inverter's reliability, in particular, the power decoupling capacitors.

Original languageEnglish
Title of host publicationAPEC 2012 - 27th Annual IEEE Applied Power Electronics Conference and Exposition
Pages898-903
Number of pages6
DOIs
Publication statusPublished - 2012
Externally publishedYes
Event27th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2012 - Orlando, FL, United States
Duration: 5 Feb 20129 Feb 2012

Other

Other27th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2012
CountryUnited States
CityOrlando, FL
Period5/2/129/2/12

Fingerprint

Topology
Capacitors
Temperature

Keywords

  • micro-inverter
  • MIL-HDBK-217
  • photovoltaic
  • power decoupling
  • reliability
  • single-phase inverter

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Harb, S., & Balog, R. (2012). Reliability of candidate photovoltaic module-integrated-inverter topologies. In APEC 2012 - 27th Annual IEEE Applied Power Electronics Conference and Exposition (pp. 898-903). [6165925] https://doi.org/10.1109/APEC.2012.6165925

Reliability of candidate photovoltaic module-integrated-inverter topologies. / Harb, Souhib; Balog, Robert.

APEC 2012 - 27th Annual IEEE Applied Power Electronics Conference and Exposition. 2012. p. 898-903 6165925.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Harb, S & Balog, R 2012, Reliability of candidate photovoltaic module-integrated-inverter topologies. in APEC 2012 - 27th Annual IEEE Applied Power Electronics Conference and Exposition., 6165925, pp. 898-903, 27th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2012, Orlando, FL, United States, 5/2/12. https://doi.org/10.1109/APEC.2012.6165925
Harb S, Balog R. Reliability of candidate photovoltaic module-integrated-inverter topologies. In APEC 2012 - 27th Annual IEEE Applied Power Electronics Conference and Exposition. 2012. p. 898-903. 6165925 https://doi.org/10.1109/APEC.2012.6165925
Harb, Souhib ; Balog, Robert. / Reliability of candidate photovoltaic module-integrated-inverter topologies. APEC 2012 - 27th Annual IEEE Applied Power Electronics Conference and Exposition. 2012. pp. 898-903
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