Reliability of a PV-module integrated inverter (PV-MII)

A usage model approach

Souhib Harb, Robert Balog

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

This paper proposes a new methodology for calculating the mean time between failure (MTBF) of a photovoltaic module-integrated or module-attached inverter (PV-MII). Based on a stress-factor approach, the technique invokes the usage model for the inverter to determine the statistical distribution of thermal and electrical stresses for the electrical components. The salient feature of the proposed methodology takes into account the operating environment volatility of the module-integrated (MI) electronics to calculate the MTBF of the MII. This leads to more realistic assessment of reliability than if a single worst-case operating point were used. Measured data (temperature and insolation level) is used to experimentally verify the efficacy of the proposed methodology. The results confirm that the electrolytic capacitor is the most vulnerable component with the lowest MTBF, but more importantly provide a quantified assessment of realistic MTBF under expected operating conditions rather than extrapolating a conclusion based upon a single worst-case operating point, which may have a low probability of occurrence.

Original languageEnglish
Title of host publicationProgram - 38th IEEE Photovoltaic Specialists Conference, PVSC 2012
Pages1756-1761
Number of pages6
DOIs
Publication statusPublished - 2012
Externally publishedYes
Event38th IEEE Photovoltaic Specialists Conference, PVSC 2012 - Austin, TX, United States
Duration: 3 Jun 20128 Jun 2012

Other

Other38th IEEE Photovoltaic Specialists Conference, PVSC 2012
CountryUnited States
CityAustin, TX
Period3/6/128/6/12

Fingerprint

Electrolytic capacitors
Incident solar radiation
Electronic equipment
Temperature
Hot Temperature

Keywords

  • inverter
  • micro-inverter
  • MIL- HDBK-217
  • Photovoltaic (PV)
  • reliability

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Control and Systems Engineering
  • Industrial and Manufacturing Engineering

Cite this

Harb, S., & Balog, R. (2012). Reliability of a PV-module integrated inverter (PV-MII): A usage model approach. In Program - 38th IEEE Photovoltaic Specialists Conference, PVSC 2012 (pp. 1756-1761). [6317934] https://doi.org/10.1109/PVSC.2012.6317934

Reliability of a PV-module integrated inverter (PV-MII) : A usage model approach. / Harb, Souhib; Balog, Robert.

Program - 38th IEEE Photovoltaic Specialists Conference, PVSC 2012. 2012. p. 1756-1761 6317934.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Harb, S & Balog, R 2012, Reliability of a PV-module integrated inverter (PV-MII): A usage model approach. in Program - 38th IEEE Photovoltaic Specialists Conference, PVSC 2012., 6317934, pp. 1756-1761, 38th IEEE Photovoltaic Specialists Conference, PVSC 2012, Austin, TX, United States, 3/6/12. https://doi.org/10.1109/PVSC.2012.6317934
Harb S, Balog R. Reliability of a PV-module integrated inverter (PV-MII): A usage model approach. In Program - 38th IEEE Photovoltaic Specialists Conference, PVSC 2012. 2012. p. 1756-1761. 6317934 https://doi.org/10.1109/PVSC.2012.6317934
Harb, Souhib ; Balog, Robert. / Reliability of a PV-module integrated inverter (PV-MII) : A usage model approach. Program - 38th IEEE Photovoltaic Specialists Conference, PVSC 2012. 2012. pp. 1756-1761
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