Recombination stability in polycrystalline Cu2ZnSnSe4 thin films

Marie Buffiere, Guy Brammertz, Abdel Aziz El Mel, Nick Lenaers, Yi Ren, Armin E. Zaghi, Yves Mols, Christine Koeble, Jef Vleugels, Marc Meuris, Jef Poortmans

Research output: Chapter in Book/Report/Conference proceedingConference contribution

19 Citations (Scopus)

Abstract

Time-resolved photoluminescence analysis shows that as-grown Cu 2ZnSnSe4 (CZTSe) thin films degrade when they are exposed to air. The analysis of the films prior to degradation reveals relatively long carrier lifetimes. The increase of the recombination rates significantly affects the performance of the related solar cells. Among all the chemical treatments tested to recover the lifetime of the carrier after air exposure, the KCN etching seems to be the most efficient.

Original languageEnglish
Title of host publication39th IEEE Photovoltaic Specialists Conference, PVSC 2013
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1941-1944
Number of pages4
ISBN (Print)9781479932993
DOIs
Publication statusPublished - 1 Jan 2013
Event39th IEEE Photovoltaic Specialists Conference, PVSC 2013 - Tampa, FL, United States
Duration: 16 Jun 201321 Jun 2013

Publication series

NameConference Record of the IEEE Photovoltaic Specialists Conference
ISSN (Print)0160-8371

Other

Other39th IEEE Photovoltaic Specialists Conference, PVSC 2013
CountryUnited States
CityTampa, FL
Period16/6/1321/6/13

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Keywords

  • CZTSe
  • Charge carrier lifetime
  • Solar cells
  • Surface properties
  • Thin films

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Industrial and Manufacturing Engineering
  • Electrical and Electronic Engineering

Cite this

Buffiere, M., Brammertz, G., Mel, A. A. E., Lenaers, N., Ren, Y., Zaghi, A. E., Mols, Y., Koeble, C., Vleugels, J., Meuris, M., & Poortmans, J. (2013). Recombination stability in polycrystalline Cu2ZnSnSe4 thin films. In 39th IEEE Photovoltaic Specialists Conference, PVSC 2013 (pp. 1941-1944). [6744850] (Conference Record of the IEEE Photovoltaic Specialists Conference). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PVSC.2013.6744850