Radiation-induced reduction of ceria in single and polycrystalline thin films

A. Kumar, R. Devanathan, V. Shutthanandan, S. V N T Kuchibhatla, A. S. Karakoti, Y. Yong, S. Thevuthasan, S. Seal

Research output: Contribution to journalArticle

21 Citations (Scopus)

Abstract

The effect of radiation on the oxidation state of Ce in high-quality single and polycrystalline ceria thin films is presented. The films were synthesized by molecular beam epitaxy and irradiated with high energy ionizing radiation of 2 MeV He + ions with varying flux density. The surface chemistry of the irradiated ceria thin films was characterized by in situ X-ray photoelectron spectroscopy (XPS). Upon irradiation, the concentration of Ce 3+ increased by 13 and 19% in single and polycrystalline ceria, respectively. Molecular dynamics simulation of thermal spikes and displacement cascade damage provide details of radiation induced defects at the end of the range of the ions that can contribute to the observed reduction.

Original languageEnglish
Pages (from-to)361-366
Number of pages6
JournalJournal of Physical Chemistry C
Volume116
Issue number1
DOIs
Publication statusPublished - 12 Jan 2012
Externally publishedYes

    Fingerprint

ASJC Scopus subject areas

  • Physical and Theoretical Chemistry
  • Electronic, Optical and Magnetic Materials
  • Surfaces, Coatings and Films
  • Energy(all)

Cite this

Kumar, A., Devanathan, R., Shutthanandan, V., Kuchibhatla, S. V. N. T., Karakoti, A. S., Yong, Y., Thevuthasan, S., & Seal, S. (2012). Radiation-induced reduction of ceria in single and polycrystalline thin films. Journal of Physical Chemistry C, 116(1), 361-366. https://doi.org/10.1021/jp209345w