Quantification of arsenic in activated carbon using particle induced X-ray emission

Nirbhay N. Yadav, Saravanamuthu Maheswaran, Vaithiyalingam Shutthanandan, Suntharampillai Thevuthasan, Huu H. Ngo, Saravanamuth Vigneswaran

Research output: Contribution to journalArticle

Abstract

To date, the trace elemental analysis of solids with inhomogeneous internal structure has been limited, particularly in the case of adsorbents. High-energy ion beam based particle induced X-ray emission (PIXE) is an ideal analytical tool suitable for simultaneous quantification of trace elements with high accuracy. In this study, PIXE was used to quantify arsenic in the adsorbents, granular activated carbon (GAC) and powder activated carbon (PAC). Pelletized and unmodified GAC and PAC samples were analyzed along with powder samples deposited on thin teflon filters. These sample preparation methods resulted in samples of various thicknesses and densities. PIXE measurements taken from these samples were compared to results from neutron activation analysis (NAA) and atomic absorption spectroscopy (AAS). There is a good agreement between the values from the NAA and pelletized PIXE measurements and some AAS measurements.

Original languageEnglish
Pages (from-to)191-196
Number of pages6
JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume251
Issue number1
DOIs
Publication statusPublished - Sep 2006
Externally publishedYes

Fingerprint

Arsenic
activated carbon
arsenic
Activated carbon
Powders
X rays
Atomic spectroscopy
Neutron activation analysis
Absorption spectroscopy
neutron activation analysis
Adsorbents
adsorbents
x rays
absorption spectroscopy
Polytetrafluoroethylene
Trace Elements
Trace elements
Polytetrafluoroethylenes
Ion beams
teflon (trademark)

Keywords

  • AAS
  • Activated carbon
  • NAA
  • Pelletization
  • PIXE

ASJC Scopus subject areas

  • Surfaces, Coatings and Films
  • Instrumentation
  • Surfaces and Interfaces

Cite this

Quantification of arsenic in activated carbon using particle induced X-ray emission. / Yadav, Nirbhay N.; Maheswaran, Saravanamuthu; Shutthanandan, Vaithiyalingam; Thevuthasan, Suntharampillai; Ngo, Huu H.; Vigneswaran, Saravanamuth.

In: Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, Vol. 251, No. 1, 09.2006, p. 191-196.

Research output: Contribution to journalArticle

Yadav, Nirbhay N. ; Maheswaran, Saravanamuthu ; Shutthanandan, Vaithiyalingam ; Thevuthasan, Suntharampillai ; Ngo, Huu H. ; Vigneswaran, Saravanamuth. / Quantification of arsenic in activated carbon using particle induced X-ray emission. In: Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms. 2006 ; Vol. 251, No. 1. pp. 191-196.
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