Probing photoelectron multiple interferences via Fourier spectroscopy in energetic photoionization of Xe@C60

Andrea Potter, Matthew A. McCune, Ruma De, Mohamed Madjet, Himadri S. Chakraborty

Research output: Contribution to journalArticle

12 Citations (Scopus)

Abstract

Considering the photoionization of the Xe@C60 endohedral compound, we study in detail the ionization cross sections of various levels of the system at energies higher than the plasmon resonance region. Five classes of single-electron levels are identified depending on their spectral character. Each class engenders distinct oscillations in the cross section, emerging from the interference between active ionization modes specific to that class. Analysis of the cross sections based on their Fourier transforms unravels oscillation frequencies that carry unique fingerprints of the emitting level.

Original languageEnglish
Article number033201
JournalPhysical Review A - Atomic, Molecular, and Optical Physics
Volume82
Issue number3
DOIs
Publication statusPublished - 17 Sep 2010
Externally publishedYes

Fingerprint

photoionization
photoelectrons
interference
spectroscopy
oscillations
cross sections
ionization cross sections
emerging
ionization
electrons
energy

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

Cite this

Probing photoelectron multiple interferences via Fourier spectroscopy in energetic photoionization of Xe@C60. / Potter, Andrea; McCune, Matthew A.; De, Ruma; Madjet, Mohamed; Chakraborty, Himadri S.

In: Physical Review A - Atomic, Molecular, and Optical Physics, Vol. 82, No. 3, 033201, 17.09.2010.

Research output: Contribution to journalArticle

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