Preparation and magnetoresistance of lanthanum manganites and silver chalcogenide tiiin films

Klaus H. Dahmen, Ilya S. Chuprakov, Ed S. Gillman, M. Ming Li

Research output: Chapter in Book/Report/Conference proceedingChapter

Abstract

The effect of texture and orientation on the resistance (OT and 6T) and magnetoresistance (MR) of La j-xCa xMnO s (LCMO) and Ag2Te thin films on various substrates has been investigated. Similar features were found in the MR dependence of thin films of these compounds despite the fact that they belong to different types of MR materials. Epitaxial or strongly oriented films exhibit a peaked MR behavior while for polycrystalline films this curve does not have sharp features. Sign reversal effect of MR was found also in thin films of Ag2Te. MR changes from positive at transverse field-current orientation to negative at parallel orientation.

Original languageEnglish
Title of host publicationMaterials Research Society Symposium - Proceedings
Pages39-44
Number of pages6
Volume547
Publication statusPublished - 1999
Externally publishedYes

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ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials

Cite this

Dahmen, K. H., Chuprakov, I. S., Gillman, E. S., & Ming Li, M. (1999). Preparation and magnetoresistance of lanthanum manganites and silver chalcogenide tiiin films. In Materials Research Society Symposium - Proceedings (Vol. 547, pp. 39-44)