The effect of texture and orientation on the resistance (OT and 6T) and magnetoresistance (MR) of La j-xCa xMnO s (LCMO) and Ag2Te thin films on various substrates has been investigated. Similar features were found in the MR dependence of thin films of these compounds despite the fact that they belong to different types of MR materials. Epitaxial or strongly oriented films exhibit a peaked MR behavior while for polycrystalline films this curve does not have sharp features. Sign reversal effect of MR was found also in thin films of Ag2Te. MR changes from positive at transverse field-current orientation to negative at parallel orientation.
|Title of host publication||Materials Research Society Symposium - Proceedings|
|Number of pages||6|
|Publication status||Published - 1999|
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials