Predicting capacitor reliability in a module-integrated photovoltaic inverter using stress factors from an environmental usage model

Samantha J. Castillo, Robert Balog, Prasad Enjeti

Research output: Chapter in Book/Report/Conference proceedingConference contribution

22 Citations (Scopus)

Abstract

In order for photovoltaic energy to achieve grid parity, the levelized cost of energy (the total lifetime cost) must be reduced. This is not possible by addressing only the solar cells since the inverter is a critical weak link in the system. It is well known that aluminum electrolytic capacitors, ubiquitous in power electronic converters, have end-of-life and failure modes that are sensitive to environmental conditions including temperature. In an Aepv system the inverter is mounted on the photovoltaic (PV) module which exposes the capacitors to potentially elevated temperatures which can increase their failure rate. Existing techniques of derating the capacitors increase the cost of the inverter, so they must be applied judiciously. This paper presents a technique to more accurately compute the MTBF of the capacitors used in a PV inverter by utilizing a thermal model of the PV module to predict operating temperature.

Original languageEnglish
Title of host publicationNorth American Power Symposium 2010, NAPS 2010
DOIs
Publication statusPublished - 2010
Externally publishedYes
EventNorth American Power Symposium 2010, NAPS 2010 - Arlington, TX, United States
Duration: 26 Sep 201028 Sep 2010

Other

OtherNorth American Power Symposium 2010, NAPS 2010
CountryUnited States
CityArlington, TX
Period26/9/1028/9/10

Fingerprint

Capacitors
Electrolytic capacitors
Costs
Power electronics
Temperature
Failure modes
Solar cells
Aluminum
Hot Temperature

ASJC Scopus subject areas

  • Energy Engineering and Power Technology

Cite this

Predicting capacitor reliability in a module-integrated photovoltaic inverter using stress factors from an environmental usage model. / Castillo, Samantha J.; Balog, Robert; Enjeti, Prasad.

North American Power Symposium 2010, NAPS 2010. 2010. 5618955.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Castillo, SJ, Balog, R & Enjeti, P 2010, Predicting capacitor reliability in a module-integrated photovoltaic inverter using stress factors from an environmental usage model. in North American Power Symposium 2010, NAPS 2010., 5618955, North American Power Symposium 2010, NAPS 2010, Arlington, TX, United States, 26/9/10. https://doi.org/10.1109/NAPS.2010.5618955
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