Oxygen analysis using energetic ion beams

W. Jiang, V. Shutthanandan, S. Thevuthasan, D. E. McCready, W. J. Weber

Research output: Contribution to journalArticle

12 Citations (Scopus)

Abstract

Using a thin amorphous layer of SiO2 (5.2 μg/cm2) on Si, cross sections for the nuclear reactions 16O(d,p1)17O, 16O(d,α)14N and 16O(α,α)16O at a laboratory angle of 150 ° are determined over energies ranging from 0.701 to 1.057 MeV for D+ ions and from 2.949 to 3.049 MeV for He+ ions. The results are plotted and tabulated as a function of ion energy, with typical uncertainties of 4% for the cross section data and of ± 5 keV for the resonance energy. An example for the analysis of atomic displacements on the O sublattice in a Au2+-irradiated SrTiO3 single crystal is given.

Original languageEnglish
Pages (from-to)453-461
Number of pages9
JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume207
Issue number4
DOIs
Publication statusPublished - Aug 2003
Externally publishedYes

Fingerprint

Ion beams
ion beams
Ions
Oxygen
oxygen
ions
Nuclear reactions
cross sections
nuclear reactions
sublattices
energy
Single crystals
single crystals
strontium titanium oxide
Uncertainty

Keywords

  • Nuclear reaction
  • Oxygen analysis
  • Reaction cross section

ASJC Scopus subject areas

  • Surfaces, Coatings and Films
  • Instrumentation
  • Surfaces and Interfaces

Cite this

Oxygen analysis using energetic ion beams. / Jiang, W.; Shutthanandan, V.; Thevuthasan, S.; McCready, D. E.; Weber, W. J.

In: Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, Vol. 207, No. 4, 08.2003, p. 453-461.

Research output: Contribution to journalArticle

Jiang, W. ; Shutthanandan, V. ; Thevuthasan, S. ; McCready, D. E. ; Weber, W. J. / Oxygen analysis using energetic ion beams. In: Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms. 2003 ; Vol. 207, No. 4. pp. 453-461.
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