Oxygen analysis using energetic ion beams

W. Jiang, V. Shutthanandan, S. Thevuthasan, D. E. McCready, W. J. Weber

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    12 Citations (Scopus)


    Using a thin amorphous layer of SiO2 (5.2 μg/cm2) on Si, cross sections for the nuclear reactions 16O(d,p1)17O, 16O(d,α)14N and 16O(α,α)16O at a laboratory angle of 150 ° are determined over energies ranging from 0.701 to 1.057 MeV for D+ ions and from 2.949 to 3.049 MeV for He+ ions. The results are plotted and tabulated as a function of ion energy, with typical uncertainties of 4% for the cross section data and of ± 5 keV for the resonance energy. An example for the analysis of atomic displacements on the O sublattice in a Au2+-irradiated SrTiO3 single crystal is given.

    Original languageEnglish
    Pages (from-to)453-461
    Number of pages9
    JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
    Issue number4
    Publication statusPublished - 1 Aug 2003



    • Nuclear reaction
    • Oxygen analysis
    • Reaction cross section

    ASJC Scopus subject areas

    • Nuclear and High Energy Physics
    • Instrumentation

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