Overview of the 3rd international competition on plagiarism detection

Martin Potthast, Andreas Eiselt, Alberto Barron, Benno Stein, Paolo Rosso

Research output: Chapter in Book/Report/Conference proceedingConference contribution

30 Citations (Scopus)

Abstract

This paper overviews eleven plagiarism detectors that have been developed and evaluated within PAN'11. We survey the detection approaches developed for the two sub-tasks "external plagiarism detection" and "intrinsic plagiarism detection," and we report on their detailed evaluation based on the third revised edition of the PAN plagiarism corpus PAN-PC-11.

Original languageEnglish
Title of host publicationCEUR Workshop Proceedings
PublisherCEUR-WS
Volume1177
Publication statusPublished - 2011
Externally publishedYes
Event2011 Working Notes for CLEF Conference, CLEF 2011 - Amsterdam, Netherlands
Duration: 19 Sep 201122 Sep 2011

Other

Other2011 Working Notes for CLEF Conference, CLEF 2011
CountryNetherlands
CityAmsterdam
Period19/9/1122/9/11

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ASJC Scopus subject areas

  • Computer Science(all)

Cite this

Potthast, M., Eiselt, A., Barron, A., Stein, B., & Rosso, P. (2011). Overview of the 3rd international competition on plagiarism detection. In CEUR Workshop Proceedings (Vol. 1177). CEUR-WS.