Overview of the 2nd international competition on plagiarism detection

Martin Potthast, Alberto Barron, Andreas Eiselt, Benno Stein, Paolo Rosso

Research output: Chapter in Book/Report/Conference proceedingConference contribution

43 Citations (Scopus)

Abstract

This paper overviews 18 plagiarism detectors that have been developed and evaluated within PAN'10. We start with a unified retrieval process that summarizes the best practices employed this year. Then, the detectors' performances are evaluated in detail, highlighting several important aspects of plagiarism detection, such as obfuscation, intrinsic vs. external plagiarism, and plagiarism case length. Finally, all results are compared to those of last year's competition.

Original languageEnglish
Title of host publicationCEUR Workshop Proceedings
PublisherCEUR-WS
Volume1176
Publication statusPublished - 2010
Externally publishedYes
Event2010 Working Notes for CLEF Conference, CLEF 2010 - Padua, Italy
Duration: 22 Sep 201023 Sep 2010

Other

Other2010 Working Notes for CLEF Conference, CLEF 2010
CountryItaly
CityPadua
Period22/9/1023/9/10

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ASJC Scopus subject areas

  • Computer Science(all)

Cite this

Potthast, M., Barron, A., Eiselt, A., Stein, B., & Rosso, P. (2010). Overview of the 2nd international competition on plagiarism detection. In CEUR Workshop Proceedings (Vol. 1176). CEUR-WS.