Overview of the 1st international competition on plagiarism detection

Martin Potthast, Benno Stein, Andreas Eiselt, Alberto Barron, Paolo Rosso

Research output: Chapter in Book/Report/Conference proceedingConference contribution

83 Citations (Scopus)

Abstract

The 1st International Competition on Plagiarism Detection, held in conjunction with the 3rd PAN workshop on Uncovering Plagiarism, Authorship, and Social Software Misuse, brought together researchers from many disciplines around the exciting retrieval task of automatic plagiarism detection. The competition was divided into the subtasks external plagiarism detection and intrinsic plagiarism detection, which were tackled by 13 participating groups. An important by-product of the competition is an evaluation framework for plagiarism detection, which consists of a large-scale plagiarism corpus and detection quality measures. The framework may serve as a unified test environment to compare future plagiarism detection research. In this paper we describe the corpus design and the quality measures, survey the detection approaches developed by the participants, and compile the achieved performance results of the competitors.

Original languageEnglish
Title of host publicationCEUR Workshop Proceedings
Pages1-9
Number of pages9
Volume502
Publication statusPublished - 2009
Externally publishedYes
EventSEPLN 2009 - 3rd Workshop on Uncovering Plagiarism, Authorship and Social Software Misuse, PAN 2009 and 1st International Competition on Plagiarism Detection - San Sebastian (Donostia), Spain
Duration: 10 Sep 200910 Sep 2009

Other

OtherSEPLN 2009 - 3rd Workshop on Uncovering Plagiarism, Authorship and Social Software Misuse, PAN 2009 and 1st International Competition on Plagiarism Detection
CountrySpain
CitySan Sebastian (Donostia)
Period10/9/0910/9/09

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Keywords

  • Competition
  • Evaluation framework
  • Plagiarism detection

ASJC Scopus subject areas

  • Computer Science(all)

Cite this

Potthast, M., Stein, B., Eiselt, A., Barron, A., & Rosso, P. (2009). Overview of the 1st international competition on plagiarism detection. In CEUR Workshop Proceedings (Vol. 502, pp. 1-9)