Origin of anomalous polarization offsets in compositionally graded Pb(Zr, Ti)O3 thin films

Mark Brazier, M. McElfresh, Said Mansour

Research output: Contribution to journalArticle

49 Citations (Scopus)

Abstract

Ferroelectric films with composition gradients normal to the substrate have recently been reported to exhibit anomalously large polarization offsets when hysteresis loops are driven with an ac voltage and measured using a Sawyer-Tower (ST) circuit. These offsets have been reported in graded Pb(Zr, Ti)O3 (over 400 μC/cm2) and graded (Ba, Sr)TiO3 (30 μC/cm2) films. In this work, it was found that the offset observed in graded Pb(Zr, Ti)O3 films can be attributed to development of a dc voltage across the ac-voltage driven film, rather than a polarization offset. Recognition of this result reduces these previously reported offset values by a factor of Cs/Cref, where Cref and Cs are the reference and sample capacitances, respectively, used in the ST circuit. These dc-voltage offsets still represent a phenomenon which may lead to novel device applications.

Original languageEnglish
Pages (from-to)299-301
Number of pages3
JournalApplied Physics Letters
Volume74
Issue number2
Publication statusPublished - 11 Jan 1999
Externally publishedYes

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electric potential
towers
polarization
thin films
capacitance
hysteresis
gradients

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Origin of anomalous polarization offsets in compositionally graded Pb(Zr, Ti)O3 thin films. / Brazier, Mark; McElfresh, M.; Mansour, Said.

In: Applied Physics Letters, Vol. 74, No. 2, 11.01.1999, p. 299-301.

Research output: Contribution to journalArticle

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