Optoelectronic measurement of x-ray synchrotron pulses: A proof of concept demonstration

Stephen M. Durbin, Aamer Mahmoud, Marc Caffee, Sergei Savikhin, Eric M. Dufresne, Haidan Wen, Yuelin Li

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

Optoelectronic detection using photoconductive coplanar stripline devices has been applied to measuring the time profile of x-ray synchrotron pulses, a proof of concept demonstration that may lead to improved time-resolved x-ray studies. Laser sampling of current vs time delay between 12 keV x-ray and 800 nm laser pulses reveal the ∼50 ps x-ray pulse width convoluted with the ∼200 ps lifetime of the conduction band carriers. For GaAs implanted with 8 MeV protons, a time profile closer to the x-ray pulse width is observed. The protons create defects over the entire depth sampled by the x-rays, trapping the x-ray excited conduction electrons and minimizing lifetime broadening of the electrical excitation.

Original languageEnglish
Article number051109
JournalApplied Physics Letters
Volume102
Issue number5
DOIs
Publication statusPublished - 4 Feb 2013
Externally publishedYes

Fingerprint

synchrotrons
pulses
x rays
pulse duration
life (durability)
protons
profiles
conduction electrons
lasers
conduction bands
time lag
sampling
trapping
defects
excitation

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Durbin, S. M., Mahmoud, A., Caffee, M., Savikhin, S., Dufresne, E. M., Wen, H., & Li, Y. (2013). Optoelectronic measurement of x-ray synchrotron pulses: A proof of concept demonstration. Applied Physics Letters, 102(5), [051109]. https://doi.org/10.1063/1.4791559

Optoelectronic measurement of x-ray synchrotron pulses : A proof of concept demonstration. / Durbin, Stephen M.; Mahmoud, Aamer; Caffee, Marc; Savikhin, Sergei; Dufresne, Eric M.; Wen, Haidan; Li, Yuelin.

In: Applied Physics Letters, Vol. 102, No. 5, 051109, 04.02.2013.

Research output: Contribution to journalArticle

Durbin, Stephen M. ; Mahmoud, Aamer ; Caffee, Marc ; Savikhin, Sergei ; Dufresne, Eric M. ; Wen, Haidan ; Li, Yuelin. / Optoelectronic measurement of x-ray synchrotron pulses : A proof of concept demonstration. In: Applied Physics Letters. 2013 ; Vol. 102, No. 5.
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