Optoelectronic measurement of x-ray synchrotron pulses: A proof of concept demonstration

Stephen M. Durbin, Aamer Mahmoud, Marc Caffee, Sergei Savikhin, Eric M. Dufresne, Haidan Wen, Yuelin Li

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2 Citations (Scopus)

Abstract

Optoelectronic detection using photoconductive coplanar stripline devices has been applied to measuring the time profile of x-ray synchrotron pulses, a proof of concept demonstration that may lead to improved time-resolved x-ray studies. Laser sampling of current vs time delay between 12 keV x-ray and 800 nm laser pulses reveal the ∼50 ps x-ray pulse width convoluted with the ∼200 ps lifetime of the conduction band carriers. For GaAs implanted with 8 MeV protons, a time profile closer to the x-ray pulse width is observed. The protons create defects over the entire depth sampled by the x-rays, trapping the x-ray excited conduction electrons and minimizing lifetime broadening of the electrical excitation.

Original languageEnglish
Article number051109
JournalApplied Physics Letters
Volume102
Issue number5
DOIs
Publication statusPublished - 4 Feb 2013
Externally publishedYes

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ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Durbin, S. M., Mahmoud, A., Caffee, M., Savikhin, S., Dufresne, E. M., Wen, H., & Li, Y. (2013). Optoelectronic measurement of x-ray synchrotron pulses: A proof of concept demonstration. Applied Physics Letters, 102(5), [051109]. https://doi.org/10.1063/1.4791559