Open-Circuit Fault Diagnosis and Fault- Tolerant Model Predictive Control of SubMultilevel Inverter

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

This paper proposes a simple open-circuit fault diagnosis and fault-tolerant control approaches for a 15-level submultilevel inverter (SMI). The proposed strategy uses a model predictive control (MPC) to regulate the output current. The fault and its location are detected by comparing the total harmonic distortion (THD) level of the inverter output voltage with the predefined performance metrics. The proposed fault-tolerant control algorithm reconfigures the switching states of the inverter according to the location of fault. Experimental investigations are conducted to show that the proposed control strategy exhibits a good performance in achieving the required control objectives in case of open-circuit faults.

Original languageEnglish
Title of host publicationProceedings - 2018 IEEE 27th International Symposium on Industrial Electronics, ISIE 2018
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages433-438
Number of pages6
Volume2018-June
ISBN (Print)9781538637050
DOIs
Publication statusPublished - 10 Aug 2018
Event27th IEEE International Symposium on Industrial Electronics, ISIE 2018 - Cairns, Australia
Duration: 13 Jun 201815 Jun 2018

Other

Other27th IEEE International Symposium on Industrial Electronics, ISIE 2018
CountryAustralia
CityCairns
Period13/6/1815/6/18

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Keywords

  • DC-AC converter
  • Fault detection
  • fault identification
  • model predictive control
  • multilevel inverter

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Control and Systems Engineering

Cite this

Bayhan, S., Trabelsi, M., Abu-Rub, H., & Rivera, M. (2018). Open-Circuit Fault Diagnosis and Fault- Tolerant Model Predictive Control of SubMultilevel Inverter. In Proceedings - 2018 IEEE 27th International Symposium on Industrial Electronics, ISIE 2018 (Vol. 2018-June, pp. 433-438). [8433820] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISIE.2018.8433820