Nitrogen analysis using energetic ion beams

W. Jiang, V. Shutthanandan, S. Thevuthasan, C. M. Wang, W. J. Weber

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

As a special case of nuclear reaction analysis (NRA), nuclear elastic scattering analysis (or non-Rutherford scattering analysis) is one of the important methods in ion beam analysis and is the preferred technique to analyze light elements in a heavy matrix. Compared with nuclear reaction, nuclear scattering usually has cross-sections several orders of magnitude larger, which allows quantitative analysis of light elements in a quicker and more convenient manner. Similar to NRA, this method complements the analysis of widely used Rutherford backscattering spectrometry. In this study, the scattering cross-sections for 14N(p,p)14N and 14N(α, α)14N at a laboratory angle of 150° are measured over energy regions from 2.480 to 3.774 MeV using an amorphous film of Si 3N4 on Si wafer. Examples for the analysis of lattice disorder on the nitrogen sublattice in Au2+-irradiated GaN single crystals will be demonstrated.

Original languageEnglish
Pages (from-to)374-378
Number of pages5
JournalSurface and Interface Analysis
Volume37
Issue number4
DOIs
Publication statusPublished - Apr 2005
Externally publishedYes

Fingerprint

Nuclear reactions
nuclear reactions
Ion beams
nuclear scattering
Nitrogen
light elements
ion beams
Scattering
nitrogen
Elastic scattering
Rutherford backscattering spectroscopy
Amorphous films
scattering cross sections
complement
Spectrometry
sublattices
quantitative analysis
backscattering
elastic scattering
Single crystals

Keywords

  • Nitrogen analysis
  • Nuclear elastic scattering
  • Scattering cross-section

ASJC Scopus subject areas

  • Physical and Theoretical Chemistry
  • Colloid and Surface Chemistry

Cite this

Jiang, W., Shutthanandan, V., Thevuthasan, S., Wang, C. M., & Weber, W. J. (2005). Nitrogen analysis using energetic ion beams. Surface and Interface Analysis, 37(4), 374-378. https://doi.org/10.1002/sia.1991

Nitrogen analysis using energetic ion beams. / Jiang, W.; Shutthanandan, V.; Thevuthasan, S.; Wang, C. M.; Weber, W. J.

In: Surface and Interface Analysis, Vol. 37, No. 4, 04.2005, p. 374-378.

Research output: Contribution to journalArticle

Jiang, W, Shutthanandan, V, Thevuthasan, S, Wang, CM & Weber, WJ 2005, 'Nitrogen analysis using energetic ion beams', Surface and Interface Analysis, vol. 37, no. 4, pp. 374-378. https://doi.org/10.1002/sia.1991
Jiang W, Shutthanandan V, Thevuthasan S, Wang CM, Weber WJ. Nitrogen analysis using energetic ion beams. Surface and Interface Analysis. 2005 Apr;37(4):374-378. https://doi.org/10.1002/sia.1991
Jiang, W. ; Shutthanandan, V. ; Thevuthasan, S. ; Wang, C. M. ; Weber, W. J. / Nitrogen analysis using energetic ion beams. In: Surface and Interface Analysis. 2005 ; Vol. 37, No. 4. pp. 374-378.
@article{975bc0f6780c4045b3e069eceeaf8b57,
title = "Nitrogen analysis using energetic ion beams",
abstract = "As a special case of nuclear reaction analysis (NRA), nuclear elastic scattering analysis (or non-Rutherford scattering analysis) is one of the important methods in ion beam analysis and is the preferred technique to analyze light elements in a heavy matrix. Compared with nuclear reaction, nuclear scattering usually has cross-sections several orders of magnitude larger, which allows quantitative analysis of light elements in a quicker and more convenient manner. Similar to NRA, this method complements the analysis of widely used Rutherford backscattering spectrometry. In this study, the scattering cross-sections for 14N(p,p)14N and 14N(α, α)14N at a laboratory angle of 150° are measured over energy regions from 2.480 to 3.774 MeV using an amorphous film of Si 3N4 on Si wafer. Examples for the analysis of lattice disorder on the nitrogen sublattice in Au2+-irradiated GaN single crystals will be demonstrated.",
keywords = "Nitrogen analysis, Nuclear elastic scattering, Scattering cross-section",
author = "W. Jiang and V. Shutthanandan and S. Thevuthasan and Wang, {C. M.} and Weber, {W. J.}",
year = "2005",
month = "4",
doi = "10.1002/sia.1991",
language = "English",
volume = "37",
pages = "374--378",
journal = "Surface and Interface Analysis",
issn = "0142-2421",
publisher = "John Wiley and Sons Ltd",
number = "4",

}

TY - JOUR

T1 - Nitrogen analysis using energetic ion beams

AU - Jiang, W.

AU - Shutthanandan, V.

AU - Thevuthasan, S.

AU - Wang, C. M.

AU - Weber, W. J.

PY - 2005/4

Y1 - 2005/4

N2 - As a special case of nuclear reaction analysis (NRA), nuclear elastic scattering analysis (or non-Rutherford scattering analysis) is one of the important methods in ion beam analysis and is the preferred technique to analyze light elements in a heavy matrix. Compared with nuclear reaction, nuclear scattering usually has cross-sections several orders of magnitude larger, which allows quantitative analysis of light elements in a quicker and more convenient manner. Similar to NRA, this method complements the analysis of widely used Rutherford backscattering spectrometry. In this study, the scattering cross-sections for 14N(p,p)14N and 14N(α, α)14N at a laboratory angle of 150° are measured over energy regions from 2.480 to 3.774 MeV using an amorphous film of Si 3N4 on Si wafer. Examples for the analysis of lattice disorder on the nitrogen sublattice in Au2+-irradiated GaN single crystals will be demonstrated.

AB - As a special case of nuclear reaction analysis (NRA), nuclear elastic scattering analysis (or non-Rutherford scattering analysis) is one of the important methods in ion beam analysis and is the preferred technique to analyze light elements in a heavy matrix. Compared with nuclear reaction, nuclear scattering usually has cross-sections several orders of magnitude larger, which allows quantitative analysis of light elements in a quicker and more convenient manner. Similar to NRA, this method complements the analysis of widely used Rutherford backscattering spectrometry. In this study, the scattering cross-sections for 14N(p,p)14N and 14N(α, α)14N at a laboratory angle of 150° are measured over energy regions from 2.480 to 3.774 MeV using an amorphous film of Si 3N4 on Si wafer. Examples for the analysis of lattice disorder on the nitrogen sublattice in Au2+-irradiated GaN single crystals will be demonstrated.

KW - Nitrogen analysis

KW - Nuclear elastic scattering

KW - Scattering cross-section

UR - http://www.scopus.com/inward/record.url?scp=17144364736&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=17144364736&partnerID=8YFLogxK

U2 - 10.1002/sia.1991

DO - 10.1002/sia.1991

M3 - Article

VL - 37

SP - 374

EP - 378

JO - Surface and Interface Analysis

JF - Surface and Interface Analysis

SN - 0142-2421

IS - 4

ER -