New equilibrium equivalence concept and its applications to robustness analysis of nonlinear systems

Leon A. Luxemburg, Garng M. Huang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This paper proposes and investigates a new equilibrium equivalence concept, which is more general than the conventional topological equivalence concept but offers easier analysis and better engineering insights for nonlinear system design. We prove an equilibrium Equivalence Theorem which guarantees the robustness of the system dynamics under structured perturbations with certain fairly general assumptions. Concepts of Equilibrium Equivalence and Equilibrium Equivalence Structural Stability are developed and applied to studies of bifurcations of vector fields on noncompact manifolds. Constructive approach to Equilibrium Equivalence Structural Stability verification is emphasized. Some applications to nonlinear stability analysis are demonstrated.

Original languageEnglish
Title of host publicationProceedings of the IEEE Conference on Decision and Control
PublisherPubl by IEEE
Pages1494-1500
Number of pages7
ISBN (Print)0780312988
Publication statusPublished - 1 Dec 1993
EventProceedings of the 32nd IEEE Conference on Decision and Control. Part 2 (of 4) - San Antonio, TX, USA
Duration: 15 Dec 199317 Dec 1993

Publication series

NameProceedings of the IEEE Conference on Decision and Control
Volume2
ISSN (Print)0191-2216

Other

OtherProceedings of the 32nd IEEE Conference on Decision and Control. Part 2 (of 4)
CitySan Antonio, TX, USA
Period15/12/9317/12/93

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Modelling and Simulation
  • Control and Optimization

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  • Cite this

    Luxemburg, L. A., & Huang, G. M. (1993). New equilibrium equivalence concept and its applications to robustness analysis of nonlinear systems. In Proceedings of the IEEE Conference on Decision and Control (pp. 1494-1500). (Proceedings of the IEEE Conference on Decision and Control; Vol. 2). Publ by IEEE.