NanoSIMS imaging alteration layers of a leached SON68 glass via a FIB-made wedged crater

Yi Chung Wang, Daniel K. Schreiber, James J. Neeway, Suntharampillai Thevuthasan, James E. Evans, Joseph V. Ryan, Zihua Zhua, Wei David Wei

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

Currently, nuclear wastes are commonly immobilized into glasses because of their long-term durability. Exposure to water for long periods, however, will eventually corrode the waste form and is the leading potential avenue for radionuclide release into the environment. Because such slow processes cannot be experimentally tested, the prediction of release requires a thorough understanding of the mechanisms governing glass corrosion. In addition, because of the exceptional durability of glass, much of the testing must be performed on high-surface area powders. A technique that can provide accurate compositional profiles with nanometer scale depth resolution for non-flat samples would be a major benefit to the field. In this study, NanoSIMS was used to image the cross section of the corrosion layers of a leached SON68 glass sample. A wedged crater was prepared by a focused ion beam instrument to obtain a five-fold improvement in depth information for NanoSIMS measurements. This improvement allowed us to confirm that the breakdown of the silica glass network is further from the pristine glass than a second dissolution front for boron, another glass former, despite only ∼50nm distance between them. More importantly, NanoSIMS images show that the roughness majorly exists in Si corrosion layer. This novel sample geometry will be a major benefit to efficient NanoSIMS sampling of irregular interfaces at the nanometer scale that would otherwise be obscured within time-of-f light secondary ion mass spectroscopy depth profiles.

Original languageEnglish
Pages (from-to)233-237
Number of pages5
JournalSurface and Interface Analysis
Volume46
Issue numberS1
DOIs
Publication statusPublished - 1 Nov 2014
Externally publishedYes

Fingerprint

craters
Imaging techniques
Glass
glass
corrosion
Corrosion
durability
Durability
Radioactive Waste
Boron
Focused ion beams
radioactive wastes
silica glass
Fused silica
profiles
Radioactive wastes
Radioisotopes
Powders
radioactive isotopes
dissolving

Keywords

  • Corrosion
  • Focused ion beam
  • Glass
  • Imaging
  • NanoSIMS

ASJC Scopus subject areas

  • Chemistry(all)
  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Materials Chemistry
  • Surfaces, Coatings and Films

Cite this

Wang, Y. C., Schreiber, D. K., Neeway, J. J., Thevuthasan, S., Evans, J. E., Ryan, J. V., ... Wei, W. D. (2014). NanoSIMS imaging alteration layers of a leached SON68 glass via a FIB-made wedged crater. Surface and Interface Analysis, 46(S1), 233-237. https://doi.org/10.1002/sia.5585

NanoSIMS imaging alteration layers of a leached SON68 glass via a FIB-made wedged crater. / Wang, Yi Chung; Schreiber, Daniel K.; Neeway, James J.; Thevuthasan, Suntharampillai; Evans, James E.; Ryan, Joseph V.; Zhua, Zihua; Wei, Wei David.

In: Surface and Interface Analysis, Vol. 46, No. S1, 01.11.2014, p. 233-237.

Research output: Contribution to journalArticle

Wang, YC, Schreiber, DK, Neeway, JJ, Thevuthasan, S, Evans, JE, Ryan, JV, Zhua, Z & Wei, WD 2014, 'NanoSIMS imaging alteration layers of a leached SON68 glass via a FIB-made wedged crater', Surface and Interface Analysis, vol. 46, no. S1, pp. 233-237. https://doi.org/10.1002/sia.5585
Wang YC, Schreiber DK, Neeway JJ, Thevuthasan S, Evans JE, Ryan JV et al. NanoSIMS imaging alteration layers of a leached SON68 glass via a FIB-made wedged crater. Surface and Interface Analysis. 2014 Nov 1;46(S1):233-237. https://doi.org/10.1002/sia.5585
Wang, Yi Chung ; Schreiber, Daniel K. ; Neeway, James J. ; Thevuthasan, Suntharampillai ; Evans, James E. ; Ryan, Joseph V. ; Zhua, Zihua ; Wei, Wei David. / NanoSIMS imaging alteration layers of a leached SON68 glass via a FIB-made wedged crater. In: Surface and Interface Analysis. 2014 ; Vol. 46, No. S1. pp. 233-237.
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