Morphological, structural and optical properties of silver treated zinc oxide thin film

Q. A. Drmosh, M. K. Hossain, Fahhad Alharbi, Nouar Tabet

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

Abstract: Zinc oxide (ZnO) thin film with an ultrathin layer of silver (Ag) atop was fabricated on glass substrate and a simple post-deposition annealing was carried out. A systematic observation was conducted to monitor morphological, structural and optical properties. The detailed morphological analysis by scanning electron microscope revealed that ZnO film surface became irregular with small pores dispersed all over the surface after the treatment, whereas the surface became smother with an ultrathin layer of Ag atop. Nucleation of Ag nanoparticles was observed initiated at the beginning of treatment. Preferential film orientation along c-axis with wurtzite hexagonal structure and a peak shift to red after treatment was confirmed by X-ray diffraction. Further investigation revealed that a stress relaxation from −0.51 GPa (compressive stress) to 0.58 GPa (tensile stress), grain growth from 13 to 31 nm and recrystallization with decreasing lattice constant (c) from 5.2655 to 5.1395 Å occurred after treatment. A reduction in optical band gap from 3.31 to 3.25 ± 0.01 eV was observed after the treatment with a slight increase in transmittance. At higher annealing temperatures, the weak photoluminescence emission did show blue shift from 367 to 364 nm and 362 nm. Elemental and compositional analysis was carried out by X-ray photoelectron spectroscopy. Such characteristics shift in structural and optical properties, in fact, plays a crucial role in determining device performances and overall efficiency.

Original languageEnglish
Pages (from-to)139-148
Number of pages10
JournalJournal of Materials Science: Materials in Electronics
Volume26
Issue number1
DOIs
Publication statusPublished - 2014

Fingerprint

Zinc Oxide
silver oxides
Zinc oxide
Silver
zinc oxides
Oxide films
Structural properties
Optical properties
optical properties
Thin films
thin films
Annealing
Optical band gaps
Stress relaxation
Grain growth
Compressive stress
Tensile stress
Lattice constants
Photoluminescence
Nucleation

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Atomic and Molecular Physics, and Optics
  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

Cite this

Morphological, structural and optical properties of silver treated zinc oxide thin film. / Drmosh, Q. A.; Hossain, M. K.; Alharbi, Fahhad; Tabet, Nouar.

In: Journal of Materials Science: Materials in Electronics, Vol. 26, No. 1, 2014, p. 139-148.

Research output: Contribution to journalArticle

@article{8786ecf3f84a4318840cadd46f32929e,
title = "Morphological, structural and optical properties of silver treated zinc oxide thin film",
abstract = "Abstract: Zinc oxide (ZnO) thin film with an ultrathin layer of silver (Ag) atop was fabricated on glass substrate and a simple post-deposition annealing was carried out. A systematic observation was conducted to monitor morphological, structural and optical properties. The detailed morphological analysis by scanning electron microscope revealed that ZnO film surface became irregular with small pores dispersed all over the surface after the treatment, whereas the surface became smother with an ultrathin layer of Ag atop. Nucleation of Ag nanoparticles was observed initiated at the beginning of treatment. Preferential film orientation along c-axis with wurtzite hexagonal structure and a peak shift to red after treatment was confirmed by X-ray diffraction. Further investigation revealed that a stress relaxation from −0.51 GPa (compressive stress) to 0.58 GPa (tensile stress), grain growth from 13 to 31 nm and recrystallization with decreasing lattice constant (c) from 5.2655 to 5.1395 {\AA} occurred after treatment. A reduction in optical band gap from 3.31 to 3.25 ± 0.01 eV was observed after the treatment with a slight increase in transmittance. At higher annealing temperatures, the weak photoluminescence emission did show blue shift from 367 to 364 nm and 362 nm. Elemental and compositional analysis was carried out by X-ray photoelectron spectroscopy. Such characteristics shift in structural and optical properties, in fact, plays a crucial role in determining device performances and overall efficiency.",
author = "Drmosh, {Q. A.} and Hossain, {M. K.} and Fahhad Alharbi and Nouar Tabet",
year = "2014",
doi = "10.1007/s10854-014-2375-3",
language = "English",
volume = "26",
pages = "139--148",
journal = "Journal of Materials Science: Materials in Electronics",
issn = "0957-4522",
publisher = "Springer New York",
number = "1",

}

TY - JOUR

T1 - Morphological, structural and optical properties of silver treated zinc oxide thin film

AU - Drmosh, Q. A.

AU - Hossain, M. K.

AU - Alharbi, Fahhad

AU - Tabet, Nouar

PY - 2014

Y1 - 2014

N2 - Abstract: Zinc oxide (ZnO) thin film with an ultrathin layer of silver (Ag) atop was fabricated on glass substrate and a simple post-deposition annealing was carried out. A systematic observation was conducted to monitor morphological, structural and optical properties. The detailed morphological analysis by scanning electron microscope revealed that ZnO film surface became irregular with small pores dispersed all over the surface after the treatment, whereas the surface became smother with an ultrathin layer of Ag atop. Nucleation of Ag nanoparticles was observed initiated at the beginning of treatment. Preferential film orientation along c-axis with wurtzite hexagonal structure and a peak shift to red after treatment was confirmed by X-ray diffraction. Further investigation revealed that a stress relaxation from −0.51 GPa (compressive stress) to 0.58 GPa (tensile stress), grain growth from 13 to 31 nm and recrystallization with decreasing lattice constant (c) from 5.2655 to 5.1395 Å occurred after treatment. A reduction in optical band gap from 3.31 to 3.25 ± 0.01 eV was observed after the treatment with a slight increase in transmittance. At higher annealing temperatures, the weak photoluminescence emission did show blue shift from 367 to 364 nm and 362 nm. Elemental and compositional analysis was carried out by X-ray photoelectron spectroscopy. Such characteristics shift in structural and optical properties, in fact, plays a crucial role in determining device performances and overall efficiency.

AB - Abstract: Zinc oxide (ZnO) thin film with an ultrathin layer of silver (Ag) atop was fabricated on glass substrate and a simple post-deposition annealing was carried out. A systematic observation was conducted to monitor morphological, structural and optical properties. The detailed morphological analysis by scanning electron microscope revealed that ZnO film surface became irregular with small pores dispersed all over the surface after the treatment, whereas the surface became smother with an ultrathin layer of Ag atop. Nucleation of Ag nanoparticles was observed initiated at the beginning of treatment. Preferential film orientation along c-axis with wurtzite hexagonal structure and a peak shift to red after treatment was confirmed by X-ray diffraction. Further investigation revealed that a stress relaxation from −0.51 GPa (compressive stress) to 0.58 GPa (tensile stress), grain growth from 13 to 31 nm and recrystallization with decreasing lattice constant (c) from 5.2655 to 5.1395 Å occurred after treatment. A reduction in optical band gap from 3.31 to 3.25 ± 0.01 eV was observed after the treatment with a slight increase in transmittance. At higher annealing temperatures, the weak photoluminescence emission did show blue shift from 367 to 364 nm and 362 nm. Elemental and compositional analysis was carried out by X-ray photoelectron spectroscopy. Such characteristics shift in structural and optical properties, in fact, plays a crucial role in determining device performances and overall efficiency.

UR - http://www.scopus.com/inward/record.url?scp=84925511897&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84925511897&partnerID=8YFLogxK

U2 - 10.1007/s10854-014-2375-3

DO - 10.1007/s10854-014-2375-3

M3 - Article

AN - SCOPUS:84925511897

VL - 26

SP - 139

EP - 148

JO - Journal of Materials Science: Materials in Electronics

JF - Journal of Materials Science: Materials in Electronics

SN - 0957-4522

IS - 1

ER -