Microstructural characterization of chemical bath deposited and sputtered Zn(O,S) buffer layers

E. Gautron, Marie Buffiere, S. Harel, L. Assmann, L. Arzel, L. Brohan, J. Kessler, N. Barreau

Research output: Contribution to journalArticle

14 Citations (Scopus)

Abstract

The present work aims at investigating the microstructure of Zn(O,S) buffer layers relative to their deposition route, namely either chemical bath deposition (CBD) or RF co-sputtering process (PVD) under pure Ar. The core of the study consists of cross-sectional transmission electron microscopy (TEM) characterization of the differently grown Zn(O,S) thin films on co-evaporated Cu(In,Ga)Se2 (CIGSe) absorbers. It shows that the morphology of Zn(O,S) layer deposited on CIGSe using CBD process is made of a thin layer of well oriented ZnS sphalerite-(111) and/or ZnS wurtzite-(0002) planes parallel to CIGSe chalcopyrite-(112) planes at the interface with CIGSe followed by misoriented nanometer-sized ZnS crystallites in an amorphous phase. As far as (PVD)Zn(O,S) is concerned, the TEM analyses reveal two different microstructures depending on the S-content in the films: for [S] / ([O] + [S]) = 0.6, the buffer layer is made of ZnO zincite and ZnS wurtzite crystallites grown nearly coherently to each other, with (0002) planes nearly parallel with CIGSe-(112) planes, while for [S] / ([O] + [S]) = 0.3, it is made of ZnO zincite type crystals with O atoms substituted by S atoms, with (0002) planes perfectly aligned with CIGSe-(112) planes. Such microstructural differences can explain why photovoltaic performances are dependent on the Zn(O,S) buffer layer deposition route.

Original languageEnglish
Pages (from-to)175-179
Number of pages5
JournalThin Solid Films
Volume535
Issue number1
DOIs
Publication statusPublished - 15 May 2013
Externally publishedYes

Fingerprint

Buffer layers
baths
buffers
Physical vapor deposition
Crystallites
wurtzite
crystallites
Transmission electron microscopy
Atoms
Microstructure
routes
transmission electron microscopy
microstructure
Sputtering
zincblende
atoms
absorbers
Thin films
Crystals
sputtering

Keywords

  • CBD
  • CIGSe
  • Cross-sectional TEM
  • Microstructure
  • PVD
  • Zn(O,S) buffer layer

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Metals and Alloys
  • Materials Chemistry

Cite this

Microstructural characterization of chemical bath deposited and sputtered Zn(O,S) buffer layers. / Gautron, E.; Buffiere, Marie; Harel, S.; Assmann, L.; Arzel, L.; Brohan, L.; Kessler, J.; Barreau, N.

In: Thin Solid Films, Vol. 535, No. 1, 15.05.2013, p. 175-179.

Research output: Contribution to journalArticle

Gautron, E, Buffiere, M, Harel, S, Assmann, L, Arzel, L, Brohan, L, Kessler, J & Barreau, N 2013, 'Microstructural characterization of chemical bath deposited and sputtered Zn(O,S) buffer layers', Thin Solid Films, vol. 535, no. 1, pp. 175-179. https://doi.org/10.1016/j.tsf.2012.10.040
Gautron, E. ; Buffiere, Marie ; Harel, S. ; Assmann, L. ; Arzel, L. ; Brohan, L. ; Kessler, J. ; Barreau, N. / Microstructural characterization of chemical bath deposited and sputtered Zn(O,S) buffer layers. In: Thin Solid Films. 2013 ; Vol. 535, No. 1. pp. 175-179.
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