Method to determine the spring constant of atomic force microscope cantilevers

Christopher T. Gibson, Daniel J. Johnson, Christopher Anderson, Chris Abell, Trevor Rayment

Research output: Contribution to journalArticle

23 Citations (Scopus)

Abstract

A method to calibrate the spring constant of atomic force microscope cantilevers was described. The method involved a expression which relates the spring constant of any two cantilevers on the same chip. The measurement of the resonant frequency and the plain view surface area of the cantilevers was also required by the method. A limitation of this method was that the spring constant of one cantilever on the chip should be calculated accurately using another technique.

Original languageEnglish
Pages (from-to)565-567
Number of pages3
JournalReview of Scientific Instruments
Volume75
Issue number2
DOIs
Publication statusPublished - Feb 2004
Externally publishedYes

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Natural frequencies
Microscopes
microscopes
chips
plains
resonant frequencies

ASJC Scopus subject areas

  • Instrumentation
  • Physics and Astronomy (miscellaneous)

Cite this

Method to determine the spring constant of atomic force microscope cantilevers. / Gibson, Christopher T.; Johnson, Daniel J.; Anderson, Christopher; Abell, Chris; Rayment, Trevor.

In: Review of Scientific Instruments, Vol. 75, No. 2, 02.2004, p. 565-567.

Research output: Contribution to journalArticle

Gibson, Christopher T. ; Johnson, Daniel J. ; Anderson, Christopher ; Abell, Chris ; Rayment, Trevor. / Method to determine the spring constant of atomic force microscope cantilevers. In: Review of Scientific Instruments. 2004 ; Vol. 75, No. 2. pp. 565-567.
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