Measurement of particle and surface interactions using force microscopy

Nidal Hilal, Daniel Johnson, W. Richard Bowen, Paul M. Williams

Research output: Chapter in Book/Report/Conference proceedingChapter

5 Citations (Scopus)

Abstract

This chapter describes the use of the atomic force microscope (AFM) to quantitatively measure surface forces arising from the interactions between particles and between particles and surfaces. These forces are of particular interest in the study of colloidal dispersions, where the strength of interactions between particles governs the properties of the dispersion overall. Most traditional methods used to study colloidal dispersions are ensemble techniques, where the interactions of a large number of particles are measured simultaneously. The advantage with the AFM is the ability to make measurements on the single-particle level and to measure forces, and hence interaction energies, with respect to intersurface distances. Colloid probes, interaction forces, and adhesion forces measured by AFM and effect of roughness on measured adhesion and surface forces are discussed in this chapter. The forces that are likely to be encountered when measuring interactions between particles and between particles and surfaces while using the AFM are described with examples of the measurements. This study will serve a useful and practical guide to one undertaking such measurements. © 2009

Original languageEnglish
Title of host publicationAtomic Force Microscopy in Process Engineering
PublisherElsevier Ltd
Pages31-80
Number of pages50
ISBN (Print)9781856175173
DOIs
Publication statusPublished - 2009
Externally publishedYes

Fingerprint

particle interactions
surface reactions
microscopy
microscopes
interactions
adhesion
colloids
roughness

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Hilal, N., Johnson, D., Bowen, W. R., & Williams, P. M. (2009). Measurement of particle and surface interactions using force microscopy. In Atomic Force Microscopy in Process Engineering (pp. 31-80). Elsevier Ltd. https://doi.org/10.1016/B978-1-85617-517-3.00002-X

Measurement of particle and surface interactions using force microscopy. / Hilal, Nidal; Johnson, Daniel; Bowen, W. Richard; Williams, Paul M.

Atomic Force Microscopy in Process Engineering. Elsevier Ltd, 2009. p. 31-80.

Research output: Chapter in Book/Report/Conference proceedingChapter

Hilal, N, Johnson, D, Bowen, WR & Williams, PM 2009, Measurement of particle and surface interactions using force microscopy. in Atomic Force Microscopy in Process Engineering. Elsevier Ltd, pp. 31-80. https://doi.org/10.1016/B978-1-85617-517-3.00002-X
Hilal N, Johnson D, Bowen WR, Williams PM. Measurement of particle and surface interactions using force microscopy. In Atomic Force Microscopy in Process Engineering. Elsevier Ltd. 2009. p. 31-80 https://doi.org/10.1016/B978-1-85617-517-3.00002-X
Hilal, Nidal ; Johnson, Daniel ; Bowen, W. Richard ; Williams, Paul M. / Measurement of particle and surface interactions using force microscopy. Atomic Force Microscopy in Process Engineering. Elsevier Ltd, 2009. pp. 31-80
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