Magnetoresistance in thin films of silver chalcogenides

I. S. Chuprakov, V. B. Lyalikov, K. H. Dahmen, P. Xiong

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Oriented and non-oriented thin films of silver(I) telluride, Ag 2Te, were prepared by e-beam evaporation, vapor transport technique and Chemical Vapor Deposition (CVD). Crystallinity and orientation of the films were studied by Θ-2Θ XRD, rocking curve and pole figure measurements. The origin and conditions for the oriented growth are discussed. Special microdevice was prepared by photolithography from the oriented films of Ag 2Te in order to investigate magnetoresistance (MR) in this material. It was proved that the reported earlier negative MR in Ag 2Te films is a completely geometrical effect, which can be observed using non-linear arrangement of current and voltage contacts.

Original languageEnglish
Title of host publicationMaterials Research Society Symposium - Proceedings
EditorsM.S. Rzchowski, M. Kawasaki, A.J. Millis, S. Molnar, M. Rajeswari
Pages47-52
Number of pages6
Volume602
Publication statusPublished - 2000
Externally publishedYes
EventMagnetoresistive Oxides and Related Materials - Boston, MA, United States
Duration: 29 Nov 19992 Dec 1999

Other

OtherMagnetoresistive Oxides and Related Materials
CountryUnited States
CityBoston, MA
Period29/11/992/12/99

    Fingerprint

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials

Cite this

Chuprakov, I. S., Lyalikov, V. B., Dahmen, K. H., & Xiong, P. (2000). Magnetoresistance in thin films of silver chalcogenides. In M. S. Rzchowski, M. Kawasaki, A. J. Millis, S. Molnar, & M. Rajeswari (Eds.), Materials Research Society Symposium - Proceedings (Vol. 602, pp. 47-52)