Magnetoresistance in thin films of silver chalcogenides

I. S. Chuprakov, V. B. Lyalikov, K. H. Dahmen, P. Xiong

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Oriented and non-oriented thin films of silver(I) telluride, Ag2Te, were prepared by e-beam evaporation, vapor transport technique and Chemical Vapor Deposition (CVD). Crystallinity and orientation of the films were studied by Θ-2Θ XRD, rocking curve and pole figure measurements. The origin and conditions for the oriented growth are discussed. Special microdevice was prepared by photolithography from the oriented films of Ag2Te in order to investigate magnetoresistance (MR) in this material. It was proved that the reported earlier negative MR in Ag2Te films is a completely geometrical effect, which can be observed using non-linear arrangement of current and voltage contacts.

Original languageEnglish
Pages (from-to)47-52
Number of pages6
JournalMaterials Research Society Symposium-Proceedings
Publication statusPublished - 1 Jan 2000

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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    Chuprakov, I. S., Lyalikov, V. B., Dahmen, K. H., & Xiong, P. (2000). Magnetoresistance in thin films of silver chalcogenides. Materials Research Society Symposium-Proceedings, 602, 47-52.