Ion beam analysis of interface reactions in magnetite and maghemite thin films

S. Thevuthasan, D. E. McCready, W. Jiang, S. I. Yi, S. Maheswaran, K. D. Keefer, S. A. Chambers

    Research output: Contribution to journalConference article

    7 Citations (Scopus)

    Abstract

    We have investigated interface reactions between expitaxially-grown magnetite (Fe3O4) and maghemite (γ-Fe2O3) films with MgO substrates using Rutherford backscattering (RBS), channeling, and X-ray diffraction (XRD). Annealing these thin films in 2.0 × 10-6 Torr of O at temperatures up to 970 K enhances Mg outdiffusion into the films and increases the film thickness depending on temperature. The Fe3O4 film thickness reach a limiting value at 870 K anneal while the γ-Fe2O3 film thickness did not maximize after annealing at 970 K. After the annealing at 970 K, both films produced a compound with composition close to magnesioferrite (MgFe2O4). XRD results reveal the formation of MgFe2O4 films after annealing both films at 970 K in O.

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    ASJC Scopus subject areas

    • Nuclear and High Energy Physics
    • Instrumentation

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