Ion beam analysis of interface reactions in magnetite and maghemite thin films

S. Thevuthasan, D. E. McCready, W. Jiang, S. I. Yi, S. Maheswaran, K. D. Keefer, S. A. Chambers

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

We have investigated interface reactions between expitaxially-grown magnetite (Fe3O4) and maghemite (γ-Fe2O3) films with MgO substrates using Rutherford backscattering (RBS), channeling, and X-ray diffraction (XRD). Annealing these thin films in 2.0 × 10-6 Torr of O at temperatures up to 970 K enhances Mg outdiffusion into the films and increases the film thickness depending on temperature. The Fe3O4 film thickness reach a limiting value at 870 K anneal while the γ-Fe2O3 film thickness did not maximize after annealing at 970 K. After the annealing at 970 K, both films produced a compound with composition close to magnesioferrite (MgFe2O4). XRD results reveal the formation of MgFe2O4 films after annealing both films at 970 K in O.

Original languageEnglish
Pages (from-to)510-514
Number of pages5
JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume161
DOIs
Publication statusPublished - Mar 2000
Externally publishedYes

Fingerprint

Ferrosoferric Oxide
Magnetite
magnetite
Ion beams
ion beams
Thin films
Annealing
Film thickness
thin films
annealing
film thickness
X ray diffraction
Rutherford backscattering spectroscopy
diffraction
backscattering
x rays
ferric oxide
Temperature
temperature
Substrates

ASJC Scopus subject areas

  • Surfaces, Coatings and Films
  • Instrumentation
  • Surfaces and Interfaces

Cite this

Ion beam analysis of interface reactions in magnetite and maghemite thin films. / Thevuthasan, S.; McCready, D. E.; Jiang, W.; Yi, S. I.; Maheswaran, S.; Keefer, K. D.; Chambers, S. A.

In: Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, Vol. 161, 03.2000, p. 510-514.

Research output: Contribution to journalArticle

Thevuthasan, S. ; McCready, D. E. ; Jiang, W. ; Yi, S. I. ; Maheswaran, S. ; Keefer, K. D. ; Chambers, S. A. / Ion beam analysis of interface reactions in magnetite and maghemite thin films. In: Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms. 2000 ; Vol. 161. pp. 510-514.
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AU - Keefer, K. D.

AU - Chambers, S. A.

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