Abstract
We have investigated interface reactions between expitaxially-grown magnetite (Fe3O4) and maghemite (γ-Fe2O3) films with MgO substrates using Rutherford backscattering (RBS), channeling, and X-ray diffraction (XRD). Annealing these thin films in 2.0 × 10-6 Torr of O at temperatures up to 970 K enhances Mg outdiffusion into the films and increases the film thickness depending on temperature. The Fe3O4 film thickness reach a limiting value at 870 K anneal while the γ-Fe2O3 film thickness did not maximize after annealing at 970 K. After the annealing at 970 K, both films produced a compound with composition close to magnesioferrite (MgFe2O4). XRD results reveal the formation of MgFe2O4 films after annealing both films at 970 K in O.
| Original language | English |
|---|---|
| Pages (from-to) | 510-514 |
| Number of pages | 5 |
| Journal | Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms |
| Volume | 161 |
| DOIs | |
| Publication status | Published - Mar 2000 |
| Externally published | Yes |
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ASJC Scopus subject areas
- Surfaces, Coatings and Films
- Instrumentation
- Surfaces and Interfaces
Cite this
Ion beam analysis of interface reactions in magnetite and maghemite thin films. / Thevuthasan, S.; McCready, D. E.; Jiang, W.; Yi, S. I.; Maheswaran, S.; Keefer, K. D.; Chambers, S. A.
In: Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, Vol. 161, 03.2000, p. 510-514.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Ion beam analysis of interface reactions in magnetite and maghemite thin films
AU - Thevuthasan, S.
AU - McCready, D. E.
AU - Jiang, W.
AU - Yi, S. I.
AU - Maheswaran, S.
AU - Keefer, K. D.
AU - Chambers, S. A.
PY - 2000/3
Y1 - 2000/3
N2 - We have investigated interface reactions between expitaxially-grown magnetite (Fe3O4) and maghemite (γ-Fe2O3) films with MgO substrates using Rutherford backscattering (RBS), channeling, and X-ray diffraction (XRD). Annealing these thin films in 2.0 × 10-6 Torr of O at temperatures up to 970 K enhances Mg outdiffusion into the films and increases the film thickness depending on temperature. The Fe3O4 film thickness reach a limiting value at 870 K anneal while the γ-Fe2O3 film thickness did not maximize after annealing at 970 K. After the annealing at 970 K, both films produced a compound with composition close to magnesioferrite (MgFe2O4). XRD results reveal the formation of MgFe2O4 films after annealing both films at 970 K in O.
AB - We have investigated interface reactions between expitaxially-grown magnetite (Fe3O4) and maghemite (γ-Fe2O3) films with MgO substrates using Rutherford backscattering (RBS), channeling, and X-ray diffraction (XRD). Annealing these thin films in 2.0 × 10-6 Torr of O at temperatures up to 970 K enhances Mg outdiffusion into the films and increases the film thickness depending on temperature. The Fe3O4 film thickness reach a limiting value at 870 K anneal while the γ-Fe2O3 film thickness did not maximize after annealing at 970 K. After the annealing at 970 K, both films produced a compound with composition close to magnesioferrite (MgFe2O4). XRD results reveal the formation of MgFe2O4 films after annealing both films at 970 K in O.
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U2 - 10.1016/S0168-583X(99)00701-6
DO - 10.1016/S0168-583X(99)00701-6
M3 - Article
AN - SCOPUS:0033902324
VL - 161
SP - 510
EP - 514
JO - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
JF - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
SN - 0168-583X
ER -