Ion beam analysis of interface reactions in magnetite and maghemite thin films

S. Thevuthasan; D. E. McCready; W. Jiang; S. I. Yi; S. Maheswaran; K. D. Keefer; S. A. Chambers

doi:10.1016/S0168-583X(99)00701-6

Ion beam analysis of interface reactions in magnetite and maghemite thin films

S. Thevuthasan, D. E. McCready, W. Jiang, S. I. Yi, S. Maheswaran, K. D. Keefer, S. A. Chambers

Research output: Contribution to journal › Conference article

7 Citations (Scopus)

Abstract

We have investigated interface reactions between expitaxially-grown magnetite (Fe₃O₄) and maghemite (γ-Fe₂O₃) films with MgO substrates using Rutherford backscattering (RBS), channeling, and X-ray diffraction (XRD). Annealing these thin films in 2.0 × 10^-6 Torr of O at temperatures up to 970 K enhances Mg outdiffusion into the films and increases the film thickness depending on temperature. The Fe₃O₄ film thickness reach a limiting value at 870 K anneal while the γ-Fe₂O₃ film thickness did not maximize after annealing at 970 K. After the annealing at 970 K, both films produced a compound with composition close to magnesioferrite (MgFe₂O₄). XRD results reveal the formation of MgFe₂O₄ films after annealing both films at 970 K in O.

Original language	English
Pages (from-to)	510-514
Number of pages	5
Journal	Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume	161
DOIs	https://doi.org/10.1016/S0168-583X(99)00701-6
Publication status	Published - Mar 2000
Event	The 14th International Conference on Ion Beam Analysis - 6th European Conference on Accelerators in Applied Research and Technology - Dresden, Ger Duration: 26 Jul 1999 → 30 Jul 1999

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ASJC Scopus subject areas

Nuclear and High Energy Physics
Instrumentation

Cite this

Thevuthasan, S., McCready, D. E., Jiang, W., Yi, S. I., Maheswaran, S., Keefer, K. D., & Chambers, S. A. (2000). Ion beam analysis of interface reactions in magnetite and maghemite thin films. Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 161, 510-514. https://doi.org/10.1016/S0168-583X(99)00701-6

Ion beam analysis of interface reactions in magnetite and maghemite thin films. / Thevuthasan, S.; McCready, D. E.; Jiang, W.; Yi, S. I.; Maheswaran, S.; Keefer, K. D.; Chambers, S. A.

In: Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, Vol. 161, 03.2000, p. 510-514.

Research output: Contribution to journal › Conference article

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title = "Ion beam analysis of interface reactions in magnetite and maghemite thin films",

abstract = "We have investigated interface reactions between expitaxially-grown magnetite (Fe3O4) and maghemite (γ-Fe2O3) films with MgO substrates using Rutherford backscattering (RBS), channeling, and X-ray diffraction (XRD). Annealing these thin films in 2.0 × 10-6 Torr of O at temperatures up to 970 K enhances Mg outdiffusion into the films and increases the film thickness depending on temperature. The Fe3O4 film thickness reach a limiting value at 870 K anneal while the γ-Fe2O3 film thickness did not maximize after annealing at 970 K. After the annealing at 970 K, both films produced a compound with composition close to magnesioferrite (MgFe2O4). XRD results reveal the formation of MgFe2O4 films after annealing both films at 970 K in O.",

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AU - Thevuthasan, S.

AU - McCready, D. E.

AU - Jiang, W.

AU - Yi, S. I.

AU - Maheswaran, S.

AU - Keefer, K. D.

AU - Chambers, S. A.

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N2 - We have investigated interface reactions between expitaxially-grown magnetite (Fe3O4) and maghemite (γ-Fe2O3) films with MgO substrates using Rutherford backscattering (RBS), channeling, and X-ray diffraction (XRD). Annealing these thin films in 2.0 × 10-6 Torr of O at temperatures up to 970 K enhances Mg outdiffusion into the films and increases the film thickness depending on temperature. The Fe3O4 film thickness reach a limiting value at 870 K anneal while the γ-Fe2O3 film thickness did not maximize after annealing at 970 K. After the annealing at 970 K, both films produced a compound with composition close to magnesioferrite (MgFe2O4). XRD results reveal the formation of MgFe2O4 films after annealing both films at 970 K in O.

AB - We have investigated interface reactions between expitaxially-grown magnetite (Fe3O4) and maghemite (γ-Fe2O3) films with MgO substrates using Rutherford backscattering (RBS), channeling, and X-ray diffraction (XRD). Annealing these thin films in 2.0 × 10-6 Torr of O at temperatures up to 970 K enhances Mg outdiffusion into the films and increases the film thickness depending on temperature. The Fe3O4 film thickness reach a limiting value at 870 K anneal while the γ-Fe2O3 film thickness did not maximize after annealing at 970 K. After the annealing at 970 K, both films produced a compound with composition close to magnesioferrite (MgFe2O4). XRD results reveal the formation of MgFe2O4 films after annealing both films at 970 K in O.

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JO - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

JF - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

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10.1016/S0168-583X(99)00701-6