Investigation of reactive power limit induced voltage collapse

Hung Ming Chou, Garng Morton Huang, Karen L. Butler-Purry

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Voltage instability is caused by the inability of the system to meet reactive power demand. The problem of voltage instability is even more critical for an isolated microgrid, which only has generators with limited reactive power capacities. In this paper, we investigated what happens if all generators in the system hit their reactive power limit. To simplify the analysis, a simple two-bus example was used. Analytical power flow solutions was derived, and the corresponding physical interpretation was discussed. The physical constraints of the generator determined whether the power flow solution is feasible. It was found that when the reactive power limit of the generators is hit, even though there is a power flow solution, due to the physical limitation of the generator, no feasible solution exists. This causes the system to experience voltage collapse.

Original languageEnglish
Title of host publication2014 IEEE 57th International Midwest Symposium on Circuits and Systems, MWSCAS 2014
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages451-454
Number of pages4
ISBN (Electronic)9781479941346, 9781479941346
DOIs
Publication statusPublished - 1 Jan 2014
Externally publishedYes
Event2014 IEEE 57th International Midwest Symposium on Circuits and Systems, MWSCAS 2014 - College Station, United States
Duration: 3 Aug 20146 Aug 2014

Other

Other2014 IEEE 57th International Midwest Symposium on Circuits and Systems, MWSCAS 2014
CountryUnited States
CityCollege Station
Period3/8/146/8/14

Fingerprint

Reactive power
Electric potential

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

Cite this

Chou, H. M., Huang, G. M., & Butler-Purry, K. L. (2014). Investigation of reactive power limit induced voltage collapse. In 2014 IEEE 57th International Midwest Symposium on Circuits and Systems, MWSCAS 2014 (pp. 451-454). [6908449] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/MWSCAS.2014.6908449

Investigation of reactive power limit induced voltage collapse. / Chou, Hung Ming; Huang, Garng Morton; Butler-Purry, Karen L.

2014 IEEE 57th International Midwest Symposium on Circuits and Systems, MWSCAS 2014. Institute of Electrical and Electronics Engineers Inc., 2014. p. 451-454 6908449.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Chou, HM, Huang, GM & Butler-Purry, KL 2014, Investigation of reactive power limit induced voltage collapse. in 2014 IEEE 57th International Midwest Symposium on Circuits and Systems, MWSCAS 2014., 6908449, Institute of Electrical and Electronics Engineers Inc., pp. 451-454, 2014 IEEE 57th International Midwest Symposium on Circuits and Systems, MWSCAS 2014, College Station, United States, 3/8/14. https://doi.org/10.1109/MWSCAS.2014.6908449
Chou HM, Huang GM, Butler-Purry KL. Investigation of reactive power limit induced voltage collapse. In 2014 IEEE 57th International Midwest Symposium on Circuits and Systems, MWSCAS 2014. Institute of Electrical and Electronics Engineers Inc. 2014. p. 451-454. 6908449 https://doi.org/10.1109/MWSCAS.2014.6908449
Chou, Hung Ming ; Huang, Garng Morton ; Butler-Purry, Karen L. / Investigation of reactive power limit induced voltage collapse. 2014 IEEE 57th International Midwest Symposium on Circuits and Systems, MWSCAS 2014. Institute of Electrical and Electronics Engineers Inc., 2014. pp. 451-454
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