Infrared spectroscopic and X-ray diffraction characterization of iron disulphide thin films prepared by metal-organic chemical vapour deposition

A. Ennaoui, S. Schroetter, S. Fiechter, H. Tributsch

Research output: Contribution to journalArticle

11 Citations (Scopus)
Original languageEnglish
Pages (from-to)1131-1133
Number of pages3
JournalJournal of Materials Science Letters
Volume11
Issue number16
DOIs
Publication statusPublished - Jan 1992
Externally publishedYes

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Organic Chemicals
Organic chemicals
Chemical vapor deposition
Metals
Iron
Infrared radiation
X ray diffraction
Thin films
pyrite

ASJC Scopus subject areas

  • Materials Science(all)

Cite this

Infrared spectroscopic and X-ray diffraction characterization of iron disulphide thin films prepared by metal-organic chemical vapour deposition. / Ennaoui, A.; Schroetter, S.; Fiechter, S.; Tributsch, H.

In: Journal of Materials Science Letters, Vol. 11, No. 16, 01.1992, p. 1131-1133.

Research output: Contribution to journalArticle

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