Increasing symmetric key lifetime by controlled randomness

Dimitrios N. Serpanos, Artemios G. Voyiatzis

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

Key replacement in cryptographic building blocks (algorithms and protocols) is a required operation in order to meet the security requirements. The common practice is to have only one cryptographic key valid for any given time moment and periodically change this key. We propose a scheme that allows multiple keys to be valid at any moment and describe a method that allows the receiver to identify the key used for each encryption with minimum effort, while not allowing an attacker to deduce this information. The proposed scheme introduces little computational performance overhead at the price of superior security characteristics and lower bandwidth utilization for control information.

Original languageEnglish
Title of host publicationIEEE International Conference on Emerging Technologies and Factory Automation, ETFA
Pages575-580
Number of pages6
Volume2 2 OF 2 VOL
Publication statusPublished - 1 Dec 2005
Externally publishedYes
Event10th IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2005 - Catania, Italy
Duration: 19 Sep 200522 Sep 2005

Other

Other10th IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2005
CountryItaly
CityCatania
Period19/9/0522/9/05

Fingerprint

Cryptography
Bandwidth

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Serpanos, D. N., & Voyiatzis, A. G. (2005). Increasing symmetric key lifetime by controlled randomness. In IEEE International Conference on Emerging Technologies and Factory Automation, ETFA (Vol. 2 2 OF 2 VOL, pp. 575-580). [1612727]

Increasing symmetric key lifetime by controlled randomness. / Serpanos, Dimitrios N.; Voyiatzis, Artemios G.

IEEE International Conference on Emerging Technologies and Factory Automation, ETFA. Vol. 2 2 OF 2 VOL 2005. p. 575-580 1612727.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Serpanos, DN & Voyiatzis, AG 2005, Increasing symmetric key lifetime by controlled randomness. in IEEE International Conference on Emerging Technologies and Factory Automation, ETFA. vol. 2 2 OF 2 VOL, 1612727, pp. 575-580, 10th IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2005, Catania, Italy, 19/9/05.
Serpanos DN, Voyiatzis AG. Increasing symmetric key lifetime by controlled randomness. In IEEE International Conference on Emerging Technologies and Factory Automation, ETFA. Vol. 2 2 OF 2 VOL. 2005. p. 575-580. 1612727
Serpanos, Dimitrios N. ; Voyiatzis, Artemios G. / Increasing symmetric key lifetime by controlled randomness. IEEE International Conference on Emerging Technologies and Factory Automation, ETFA. Vol. 2 2 OF 2 VOL 2005. pp. 575-580
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