In-situ monitoring of the accelerated performance degradation of thin film solar cells

Mirjam Theelen, Henk Steijvers, Nicolas Barreau, Marie Buffiere, Guy Brammertz, Marco Giacomo Flammini, Robert Jan Van Vugt, Zeger Vroon, Miro Zeman

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)

Abstract

A 'hybrid' degradation setup, which allows the use of humidity, temperature and illumination as loads in order to accelerate degradation of solar cells and modules, has been designed and constructed. In this setup, the current voltage output of photovoltaic samples is automatically logged and the electrical parameters are calculated. This allows the study of the impact of illumination and damp heat induced degradation by in-situ monitoring. Additionally, this setup also allows the determination of temperature dependency of solar cells by a simple procedure.

Original languageEnglish
Title of host publication2015 IEEE 42nd Photovoltaic Specialist Conference, PVSC 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781479979448
DOIs
Publication statusPublished - 14 Dec 2015
Externally publishedYes
Event42nd IEEE Photovoltaic Specialist Conference, PVSC 2015 - New Orleans, United States
Duration: 14 Jun 201519 Jun 2015

Other

Other42nd IEEE Photovoltaic Specialist Conference, PVSC 2015
CountryUnited States
CityNew Orleans
Period14/6/1519/6/15

Fingerprint

Degradation
Monitoring
Solar cells
Lighting
Atmospheric humidity
Temperature
Electric potential
Thin film solar cells
Hot Temperature

Keywords

  • CIGS
  • CZTS
  • damp heat
  • degradation
  • humidity
  • illumination
  • solar cells
  • temperature dependency

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

Cite this

Theelen, M., Steijvers, H., Barreau, N., Buffiere, M., Brammertz, G., Flammini, M. G., ... Zeman, M. (2015). In-situ monitoring of the accelerated performance degradation of thin film solar cells. In 2015 IEEE 42nd Photovoltaic Specialist Conference, PVSC 2015 [7355639] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PVSC.2015.7355639

In-situ monitoring of the accelerated performance degradation of thin film solar cells. / Theelen, Mirjam; Steijvers, Henk; Barreau, Nicolas; Buffiere, Marie; Brammertz, Guy; Flammini, Marco Giacomo; Van Vugt, Robert Jan; Vroon, Zeger; Zeman, Miro.

2015 IEEE 42nd Photovoltaic Specialist Conference, PVSC 2015. Institute of Electrical and Electronics Engineers Inc., 2015. 7355639.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Theelen, M, Steijvers, H, Barreau, N, Buffiere, M, Brammertz, G, Flammini, MG, Van Vugt, RJ, Vroon, Z & Zeman, M 2015, In-situ monitoring of the accelerated performance degradation of thin film solar cells. in 2015 IEEE 42nd Photovoltaic Specialist Conference, PVSC 2015., 7355639, Institute of Electrical and Electronics Engineers Inc., 42nd IEEE Photovoltaic Specialist Conference, PVSC 2015, New Orleans, United States, 14/6/15. https://doi.org/10.1109/PVSC.2015.7355639
Theelen M, Steijvers H, Barreau N, Buffiere M, Brammertz G, Flammini MG et al. In-situ monitoring of the accelerated performance degradation of thin film solar cells. In 2015 IEEE 42nd Photovoltaic Specialist Conference, PVSC 2015. Institute of Electrical and Electronics Engineers Inc. 2015. 7355639 https://doi.org/10.1109/PVSC.2015.7355639
Theelen, Mirjam ; Steijvers, Henk ; Barreau, Nicolas ; Buffiere, Marie ; Brammertz, Guy ; Flammini, Marco Giacomo ; Van Vugt, Robert Jan ; Vroon, Zeger ; Zeman, Miro. / In-situ monitoring of the accelerated performance degradation of thin film solar cells. 2015 IEEE 42nd Photovoltaic Specialist Conference, PVSC 2015. Institute of Electrical and Electronics Engineers Inc., 2015.
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