Improving diamond coating on Ti6Al4V substrate using a diamond like carbon interlayer: Raman residual stress evaluation and AFM analyses

Z. Nibennanoune, D. George, F. Antoni, S. Ahzi, D. Ruch, J. Gracio, Y. Remond

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We used the micro-Raman spectroscopy to evaluate residual stresses developed in deposited diamond films on Ti6Al4V substrates. A comparison is made between specimens with and without a diamond like carbon (DLC) interlayer. The effect of seeding the specimens prior to the deposition of the diamond coating is also investigated. In addition, AFM analysis is carried out to evaluate the quality of the surface roughness. The results show that the introduction of a DLC interlayer lowered the residual stress intensity compared to the specimens without DLC. The seeding process enabled the generation of smaller grains compared to the specimens without seeding. The measured averaged residual stresses on specimens with a DLC interlayer were about half of those measured on specimens without DLC. However the seeding process, which led to a better surface finish, had a partial opposite effect on the stress intensities. This is probably due to the grain growth depending on the nucleation sites available from the seeding process.

Original languageEnglish
Pages (from-to)105-112
Number of pages8
JournalDiamond and Related Materials
Publication statusPublished - 1 Feb 2012



  • AFM
  • DLC
  • Diamond thin film
  • Raman spectroscopy
  • Residual stresses
  • Ti6Al4V

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Chemistry(all)
  • Mechanical Engineering
  • Materials Chemistry
  • Electrical and Electronic Engineering

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