Improving diamond coating on Ti6Al4V substrate using a diamond like carbon interlayer: Raman residual stress evaluation and AFM analyses

Z. Nibennanoune, D. George, F. Antoni, Said Ahzi, D. Ruch, J. Gracio, Y. Remond

Research output: Contribution to journalArticle

25 Citations (Scopus)

Abstract

We used the micro-Raman spectroscopy to evaluate residual stresses developed in deposited diamond films on Ti6Al4V substrates. A comparison is made between specimens with and without a diamond like carbon (DLC) interlayer. The effect of seeding the specimens prior to the deposition of the diamond coating is also investigated. In addition, AFM analysis is carried out to evaluate the quality of the surface roughness. The results show that the introduction of a DLC interlayer lowered the residual stress intensity compared to the specimens without DLC. The seeding process enabled the generation of smaller grains compared to the specimens without seeding. The measured averaged residual stresses on specimens with a DLC interlayer were about half of those measured on specimens without DLC. However the seeding process, which led to a better surface finish, had a partial opposite effect on the stress intensities. This is probably due to the grain growth depending on the nucleation sites available from the seeding process.

Original languageEnglish
Pages (from-to)105-112
Number of pages8
JournalDiamond and Related Materials
Volume22
DOIs
Publication statusPublished - Feb 2012
Externally publishedYes

Fingerprint

Diamond
residual stress
inoculation
interlayers
Residual stresses
Diamonds
Carbon
diamonds
atomic force microscopy
coatings
Coatings
evaluation
carbon
Substrates
Cloud seeding
Diamond films
diamond films
Grain growth
Raman spectroscopy
titanium alloy (TiAl6V4)

Keywords

  • AFM
  • Diamond thin film
  • DLC
  • Raman spectroscopy
  • Residual stresses
  • Ti6Al4V

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Materials Chemistry
  • Electrical and Electronic Engineering
  • Mechanical Engineering
  • Physics and Astronomy(all)
  • Chemistry(all)

Cite this

Improving diamond coating on Ti6Al4V substrate using a diamond like carbon interlayer : Raman residual stress evaluation and AFM analyses. / Nibennanoune, Z.; George, D.; Antoni, F.; Ahzi, Said; Ruch, D.; Gracio, J.; Remond, Y.

In: Diamond and Related Materials, Vol. 22, 02.2012, p. 105-112.

Research output: Contribution to journalArticle

@article{20b88d5d09d0454584cc14a716b68881,
title = "Improving diamond coating on Ti6Al4V substrate using a diamond like carbon interlayer: Raman residual stress evaluation and AFM analyses",
abstract = "We used the micro-Raman spectroscopy to evaluate residual stresses developed in deposited diamond films on Ti6Al4V substrates. A comparison is made between specimens with and without a diamond like carbon (DLC) interlayer. The effect of seeding the specimens prior to the deposition of the diamond coating is also investigated. In addition, AFM analysis is carried out to evaluate the quality of the surface roughness. The results show that the introduction of a DLC interlayer lowered the residual stress intensity compared to the specimens without DLC. The seeding process enabled the generation of smaller grains compared to the specimens without seeding. The measured averaged residual stresses on specimens with a DLC interlayer were about half of those measured on specimens without DLC. However the seeding process, which led to a better surface finish, had a partial opposite effect on the stress intensities. This is probably due to the grain growth depending on the nucleation sites available from the seeding process.",
keywords = "AFM, Diamond thin film, DLC, Raman spectroscopy, Residual stresses, Ti6Al4V",
author = "Z. Nibennanoune and D. George and F. Antoni and Said Ahzi and D. Ruch and J. Gracio and Y. Remond",
year = "2012",
month = "2",
doi = "10.1016/j.diamond.2011.12.023",
language = "English",
volume = "22",
pages = "105--112",
journal = "Diamond and Related Materials",
issn = "0925-9635",
publisher = "Elsevier BV",

}

TY - JOUR

T1 - Improving diamond coating on Ti6Al4V substrate using a diamond like carbon interlayer

T2 - Raman residual stress evaluation and AFM analyses

AU - Nibennanoune, Z.

AU - George, D.

AU - Antoni, F.

AU - Ahzi, Said

AU - Ruch, D.

AU - Gracio, J.

AU - Remond, Y.

PY - 2012/2

Y1 - 2012/2

N2 - We used the micro-Raman spectroscopy to evaluate residual stresses developed in deposited diamond films on Ti6Al4V substrates. A comparison is made between specimens with and without a diamond like carbon (DLC) interlayer. The effect of seeding the specimens prior to the deposition of the diamond coating is also investigated. In addition, AFM analysis is carried out to evaluate the quality of the surface roughness. The results show that the introduction of a DLC interlayer lowered the residual stress intensity compared to the specimens without DLC. The seeding process enabled the generation of smaller grains compared to the specimens without seeding. The measured averaged residual stresses on specimens with a DLC interlayer were about half of those measured on specimens without DLC. However the seeding process, which led to a better surface finish, had a partial opposite effect on the stress intensities. This is probably due to the grain growth depending on the nucleation sites available from the seeding process.

AB - We used the micro-Raman spectroscopy to evaluate residual stresses developed in deposited diamond films on Ti6Al4V substrates. A comparison is made between specimens with and without a diamond like carbon (DLC) interlayer. The effect of seeding the specimens prior to the deposition of the diamond coating is also investigated. In addition, AFM analysis is carried out to evaluate the quality of the surface roughness. The results show that the introduction of a DLC interlayer lowered the residual stress intensity compared to the specimens without DLC. The seeding process enabled the generation of smaller grains compared to the specimens without seeding. The measured averaged residual stresses on specimens with a DLC interlayer were about half of those measured on specimens without DLC. However the seeding process, which led to a better surface finish, had a partial opposite effect on the stress intensities. This is probably due to the grain growth depending on the nucleation sites available from the seeding process.

KW - AFM

KW - Diamond thin film

KW - DLC

KW - Raman spectroscopy

KW - Residual stresses

KW - Ti6Al4V

UR - http://www.scopus.com/inward/record.url?scp=84855890820&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84855890820&partnerID=8YFLogxK

U2 - 10.1016/j.diamond.2011.12.023

DO - 10.1016/j.diamond.2011.12.023

M3 - Article

AN - SCOPUS:84855890820

VL - 22

SP - 105

EP - 112

JO - Diamond and Related Materials

JF - Diamond and Related Materials

SN - 0925-9635

ER -