Impact of dynamic specimen shape evolution on the atom probe tomography results of doped epitaxial oxide multilayers: Comparison of experiment and simulation

Nitesh Madaan, Jie Bao, Manjula Nandasiri, Zhijie Xu, Suntharampillai Thevuthasan, Arun Devaraj

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

The experimental atom probe tomography (APT) results from two different specimen orientations (top-down and sideways) of a high oxygen ion conducting Samaria-doped-ceria/Scandia-stabilized-zirconia multilayer thin film solid oxide fuel cell electrolyte was compared with level-set method based field evaporation simulations for the same specimen orientations. This experiment-simulation comparison explains the dynamic specimen shape evolution and ion trajectory aberrations that can induce density artifacts in final reconstruction, leading to inaccurate estimation of interfacial intermixing. This study highlights the importance of comparing experimental results with field evaporation simulations when using APT to study oxide heterostructure interfaces.

Original languageEnglish
Article number091601
JournalApplied Physics Letters
Volume107
Issue number9
DOIs
Publication statusPublished - 31 Aug 2015

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tomography
oxides
probes
evaporation
atoms
scandium
simulation
solid oxide fuel cells
oxygen ions
zirconium oxides
artifacts
aberration
trajectories
electrolytes
conduction
thin films
ions

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Impact of dynamic specimen shape evolution on the atom probe tomography results of doped epitaxial oxide multilayers : Comparison of experiment and simulation. / Madaan, Nitesh; Bao, Jie; Nandasiri, Manjula; Xu, Zhijie; Thevuthasan, Suntharampillai; Devaraj, Arun.

In: Applied Physics Letters, Vol. 107, No. 9, 091601, 31.08.2015.

Research output: Contribution to journalArticle

Madaan, Nitesh ; Bao, Jie ; Nandasiri, Manjula ; Xu, Zhijie ; Thevuthasan, Suntharampillai ; Devaraj, Arun. / Impact of dynamic specimen shape evolution on the atom probe tomography results of doped epitaxial oxide multilayers : Comparison of experiment and simulation. In: Applied Physics Letters. 2015 ; Vol. 107, No. 9.
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