Imaging and spectroscopy of nanostructures through aberration-corrected stem

S. J. Pennycook, M. F. Chisholm, A. R. Lupini, A. Borisevich, K. Sohlberg, J. R. Mcbride, S. J. Rosenthal, D. Kumar, A. Franceschetti, Sergey Rashkeev, S. Wang, S. T. Pantelides

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The aberration-corrected STEM allows nanostructures to be investigated with greater resolution and sensitivity than ever before. Single atom sensitivity is achieved both in imaging and also for spectroscopy, for atoms on surfaces or within the bulk. Nanocrystal size, shape, surface termination, 3D structure and the presence of any defects can be seen with unprecedented ease. The improved sensitivity provides improved input for theory, allowing new insights into nanostructure properties and the origin of their unique functionality. Furthermore, the larger aperture available with aberration-corrected STEM improves the depth resolution dramatically. Nanometer depth resolution can be achieved by simply taking a focal series of images, which may then be reconstructed into a 3D rendering of the material in the same manner as with confocal optical microscopy but maintaining sensitivity to individual atoms.

Original languageEnglish
Title of host publicationMaterials Research Society Symposium Proceedings
Pages7-16
Number of pages10
Volume877
Publication statusPublished - 1 Dec 2005
Externally publishedYes
Event2005 MRS Spring Meeting - San Franciso, CA, United States
Duration: 28 Mar 20051 Apr 2005

Other

Other2005 MRS Spring Meeting
CountryUnited States
CitySan Franciso, CA
Period28/3/051/4/05

Fingerprint

Aberrations
Nanostructures
Spectroscopy
Imaging techniques
Atoms
Confocal microscopy
Nanocrystals
Optical microscopy
Defects

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials

Cite this

Pennycook, S. J., Chisholm, M. F., Lupini, A. R., Borisevich, A., Sohlberg, K., Mcbride, J. R., ... Pantelides, S. T. (2005). Imaging and spectroscopy of nanostructures through aberration-corrected stem. In Materials Research Society Symposium Proceedings (Vol. 877, pp. 7-16)

Imaging and spectroscopy of nanostructures through aberration-corrected stem. / Pennycook, S. J.; Chisholm, M. F.; Lupini, A. R.; Borisevich, A.; Sohlberg, K.; Mcbride, J. R.; Rosenthal, S. J.; Kumar, D.; Franceschetti, A.; Rashkeev, Sergey; Wang, S.; Pantelides, S. T.

Materials Research Society Symposium Proceedings. Vol. 877 2005. p. 7-16.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Pennycook, SJ, Chisholm, MF, Lupini, AR, Borisevich, A, Sohlberg, K, Mcbride, JR, Rosenthal, SJ, Kumar, D, Franceschetti, A, Rashkeev, S, Wang, S & Pantelides, ST 2005, Imaging and spectroscopy of nanostructures through aberration-corrected stem. in Materials Research Society Symposium Proceedings. vol. 877, pp. 7-16, 2005 MRS Spring Meeting, San Franciso, CA, United States, 28/3/05.
Pennycook SJ, Chisholm MF, Lupini AR, Borisevich A, Sohlberg K, Mcbride JR et al. Imaging and spectroscopy of nanostructures through aberration-corrected stem. In Materials Research Society Symposium Proceedings. Vol. 877. 2005. p. 7-16
Pennycook, S. J. ; Chisholm, M. F. ; Lupini, A. R. ; Borisevich, A. ; Sohlberg, K. ; Mcbride, J. R. ; Rosenthal, S. J. ; Kumar, D. ; Franceschetti, A. ; Rashkeev, Sergey ; Wang, S. ; Pantelides, S. T. / Imaging and spectroscopy of nanostructures through aberration-corrected stem. Materials Research Society Symposium Proceedings. Vol. 877 2005. pp. 7-16
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