HRTEM characterization of interface between iso-structural thin solid film and substrate

C. M. Wang, S. Thevuthasan, F. Gao, V. Shutthanandan, D. E. McCready, S. A. Chambers, C. H.F. Peden

    Research output: Contribution to journalArticle

    Original languageEnglish
    Pages (from-to)1160-1161
    Number of pages2
    JournalMicroscopy and Microanalysis
    Volume8
    Issue numberSUPPL. 2
    Publication statusPublished - 20 Nov 2002

    ASJC Scopus subject areas

    • Instrumentation

    Cite this

    Wang, C. M., Thevuthasan, S., Gao, F., Shutthanandan, V., McCready, D. E., Chambers, S. A., & Peden, C. H. F. (2002). HRTEM characterization of interface between iso-structural thin solid film and substrate. Microscopy and Microanalysis, 8(SUPPL. 2), 1160-1161.