HRTEM characterization of interface between iso-structural thin solid film and substrate

C. M. Wang, S. Thevuthasan, F. Gao, V. Shutthanandan, D. E. McCready, S. A. Chambers, C. H F Peden

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)1160-1161
Number of pages2
JournalMicroscopy and Microanalysis
Volume8
Issue numberSUPPL. 2
Publication statusPublished - 2002
Externally publishedYes

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ASJC Scopus subject areas

  • Instrumentation

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Wang, C. M., Thevuthasan, S., Gao, F., Shutthanandan, V., McCready, D. E., Chambers, S. A., & Peden, C. H. F. (2002). HRTEM characterization of interface between iso-structural thin solid film and substrate. Microscopy and Microanalysis, 8(SUPPL. 2), 1160-1161.

HRTEM characterization of interface between iso-structural thin solid film and substrate. / Wang, C. M.; Thevuthasan, S.; Gao, F.; Shutthanandan, V.; McCready, D. E.; Chambers, S. A.; Peden, C. H F.

In: Microscopy and Microanalysis, Vol. 8, No. SUPPL. 2, 2002, p. 1160-1161.

Research output: Contribution to journalArticle

Wang, CM, Thevuthasan, S, Gao, F, Shutthanandan, V, McCready, DE, Chambers, SA & Peden, CHF 2002, 'HRTEM characterization of interface between iso-structural thin solid film and substrate', Microscopy and Microanalysis, vol. 8, no. SUPPL. 2, pp. 1160-1161.
Wang CM, Thevuthasan S, Gao F, Shutthanandan V, McCready DE, Chambers SA et al. HRTEM characterization of interface between iso-structural thin solid film and substrate. Microscopy and Microanalysis. 2002;8(SUPPL. 2):1160-1161.
Wang, C. M. ; Thevuthasan, S. ; Gao, F. ; Shutthanandan, V. ; McCready, D. E. ; Chambers, S. A. ; Peden, C. H F. / HRTEM characterization of interface between iso-structural thin solid film and substrate. In: Microscopy and Microanalysis. 2002 ; Vol. 8, No. SUPPL. 2. pp. 1160-1161.
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