High-order analysis of outage probability in OFDMA wireless networks

Bo Bai, Wei Chen, Zhigang Cao, Khaled Letaief

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

OFDMA is a potential technology that can flexibly allocate subcarriers while providing diversity gain to multiple users. In our recent work [1], we showed a surprising result that the maximum frequency diversity gain in OFDMA systems is equal to the number of independent subcarriers, i.e., the same as that in point-to-point OFDM systems despite of the fact that multiple users will share a common set of subcarriers. However, the diversity gain only characterizes the first-order outage performance in the high SNR regime, and the outage performance in the low SNR regime, which is very important in practice, is still an open problem. In this paper, we first formulate the subcarrier allocation problem in OFDMA systems as a random bipartite graph model. Then, a more precise outage probability is derived in the high SNR regime using a high-order analysis of the maximum matching on a random bipartite graph. An approximate outage probability in the low SNR regime is also obtained by studying the complement of a random bipartite graph. It is then demonstrated that the coefficient of the second-order term in the outage probability expression is zero except for the scenario of two users with two or three subcarriers.

Original languageEnglish
Title of host publicationGLOBECOM 2009 - 2009 IEEE Global Telecommunications Conference
DOIs
Publication statusPublished - 2009
Externally publishedYes
Event2009 IEEE Global Telecommunications Conference, GLOBECOM 2009 - Honolulu, HI, United States
Duration: 30 Nov 20094 Dec 2009

Other

Other2009 IEEE Global Telecommunications Conference, GLOBECOM 2009
CountryUnited States
CityHonolulu, HI
Period30/11/094/12/09

Fingerprint

Outages
Wireless networks
Orthogonal frequency division multiplexing

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Bai, B., Chen, W., Cao, Z., & Letaief, K. (2009). High-order analysis of outage probability in OFDMA wireless networks. In GLOBECOM 2009 - 2009 IEEE Global Telecommunications Conference [5425749] https://doi.org/10.1109/GLOCOM.2009.5425749

High-order analysis of outage probability in OFDMA wireless networks. / Bai, Bo; Chen, Wei; Cao, Zhigang; Letaief, Khaled.

GLOBECOM 2009 - 2009 IEEE Global Telecommunications Conference. 2009. 5425749.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Bai, B, Chen, W, Cao, Z & Letaief, K 2009, High-order analysis of outage probability in OFDMA wireless networks. in GLOBECOM 2009 - 2009 IEEE Global Telecommunications Conference., 5425749, 2009 IEEE Global Telecommunications Conference, GLOBECOM 2009, Honolulu, HI, United States, 30/11/09. https://doi.org/10.1109/GLOCOM.2009.5425749
Bai B, Chen W, Cao Z, Letaief K. High-order analysis of outage probability in OFDMA wireless networks. In GLOBECOM 2009 - 2009 IEEE Global Telecommunications Conference. 2009. 5425749 https://doi.org/10.1109/GLOCOM.2009.5425749
Bai, Bo ; Chen, Wei ; Cao, Zhigang ; Letaief, Khaled. / High-order analysis of outage probability in OFDMA wireless networks. GLOBECOM 2009 - 2009 IEEE Global Telecommunications Conference. 2009.
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