FPGA implementation of a predictive Vector Quantization image compression algorithm for image sensor applications

Yan Wang, Amine Bermak, Abdesselam Bouzerdoum, Brian Ng

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

This paper presents a hybrid image compression scheme based on a block based compression algorithm referred to as Vector Quantization (VQ) combined with the Differential Pulse Code Modulation (DPCM) technique. The proposed image compression technique called the PVQ scheme results in enhanced image quality as compared to the standalone VQ. The generated codebooks for the PVQ scheme are more robust for image coding than that of the VQ. This made our system a suitable candidate for developing on chip image sensor with integrated data compression processor. The proposed system was validated through FPGA implementation. The resulting implementation achieved good compression and image quality with moderate system complexity.

Original languageEnglish
Title of host publicationProceedings - 4th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2008
Pages431-434
Number of pages4
DOIs
Publication statusPublished - 5 Sep 2008
Event4th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2008 - Hong Kong, SAR, Hong Kong
Duration: 23 Jan 200825 Jan 2008

Publication series

NameProceedings - 4th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2008

Other

Other4th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2008
CountryHong Kong
CityHong Kong, SAR
Period23/1/0825/1/08

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ASJC Scopus subject areas

  • Computer Graphics and Computer-Aided Design
  • Computer Science Applications
  • Electrical and Electronic Engineering

Cite this

Wang, Y., Bermak, A., Bouzerdoum, A., & Ng, B. (2008). FPGA implementation of a predictive Vector Quantization image compression algorithm for image sensor applications. In Proceedings - 4th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2008 (pp. 431-434). [4459586] (Proceedings - 4th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2008). https://doi.org/10.1109/DELTA.2008.69