Fault-tolerant operation of multilevel diode-clamped converters for a device open-circuit fault

Aparna Saha, Ali Elrayyah, Marina Sital-Dahone, Yilmaz Sozer

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This paper presents fault-tolerant operation strategies for a grid-connected three-level diode-clamped converter system. The proposed fault-tolerant control method enables continuous operation under device open-circuit failure conditions. The location of the faulty components is considered as identified. The fault-tolerant scheme is developed based on the inherent redundant voltage vectors in a three-level (3L) diode-clamped converter (DCC). By selecting an appropriate switching pattern, 3L-DCC can manage rated power with sinusoidal currents during faulty states. Therefore, the proposed solution requires no additional hardware and complex calculations. Simulation results prove the effectiveness of the proposed concept and confirm good fault handing capabilities.

Original languageEnglish
Title of host publication2017 IEEE Applied Power Electronics Conference and Exposition, APEC 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1873-1879
Number of pages7
ISBN (Electronic)9781509053667
DOIs
Publication statusPublished - 17 May 2017
Event32nd Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2017 - Tampa, United States
Duration: 26 Mar 201730 Mar 2017

Other

Other32nd Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2017
CountryUnited States
CityTampa
Period26/3/1730/3/17

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Keywords

  • Diode-clamped converter (DCC)
  • Fault tolerant operation
  • Space vector pulse width modulation (SVPWM)

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Saha, A., Elrayyah, A., Sital-Dahone, M., & Sozer, Y. (2017). Fault-tolerant operation of multilevel diode-clamped converters for a device open-circuit fault. In 2017 IEEE Applied Power Electronics Conference and Exposition, APEC 2017 (pp. 1873-1879). [7930953] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/APEC.2017.7930953