Exceeding 3 ms Minority Carrier Lifetime in n-type Non-contact Crucible Silicon

Sergio Castellanos, Maulid Kivambe, Mallory A. Jensen, Douglas M. Powell, Kazuo Nakajima, Kohei Morishita, Ryota Murai, Tonio Buonassisi

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

The presence of metal impurities and their interactions with structural defects (e.g., dislocations) are deleterious to the performance of Si-based solar cell devices. To achieve higher minority carrier lifetimes that translate into higher solar cell efficiencies, novel growth methods with low dislocation densities and reduced metal impurity concentrations have recently been developed. These methods simultaneously aim to achieve low capital expense (capex), necessary to ensure rapid industry scaling. Monocrystalline Si grown by the non-contact crucible method (NOC-Si) has the potential to achieve high bulk minority carrier lifetimes and high efficiencies at low cost given its low structural defect density. Growth in large-diameter crucibles ensures high throughput consistent with low capex. However, high temperatures, coupled with conditions during Si growth (e.g., crucible and ambient gas) can lead to the in-diffusion of impurities, compromising the potential to achieve high efficiency solar cell devices. Herein, we report high minority-carrier lifetimes exceeding 3 milliseconds (ms) in n-type NOC-Si material, achieved through a strict impurity-control procedure at the growth stage that prevents in-diffusion of impurities to the melt, coupled with a tailored defect-engineering process via optimized phosphorus gettering.

Original languageEnglish
Pages (from-to)779-784
Number of pages6
JournalEnergy Procedia
Volume92
DOIs
Publication statusPublished - 1 Aug 2016

Fingerprint

Carrier lifetime
Crucibles
Impurities
Silicon
Solar cells
Defects
Defect density
Metals
Phosphorus
Throughput
Gases
Costs
Industry
Temperature

Keywords

  • defects
  • impurities
  • minority-carrier lifetime
  • non-contact crucible
  • silicon
  • solar cells
  • top-seeded solution growth

ASJC Scopus subject areas

  • Energy(all)

Cite this

Castellanos, S., Kivambe, M., Jensen, M. A., Powell, D. M., Nakajima, K., Morishita, K., ... Buonassisi, T. (2016). Exceeding 3 ms Minority Carrier Lifetime in n-type Non-contact Crucible Silicon. Energy Procedia, 92, 779-784. https://doi.org/10.1016/j.egypro.2016.07.068

Exceeding 3 ms Minority Carrier Lifetime in n-type Non-contact Crucible Silicon. / Castellanos, Sergio; Kivambe, Maulid; Jensen, Mallory A.; Powell, Douglas M.; Nakajima, Kazuo; Morishita, Kohei; Murai, Ryota; Buonassisi, Tonio.

In: Energy Procedia, Vol. 92, 01.08.2016, p. 779-784.

Research output: Contribution to journalArticle

Castellanos, S, Kivambe, M, Jensen, MA, Powell, DM, Nakajima, K, Morishita, K, Murai, R & Buonassisi, T 2016, 'Exceeding 3 ms Minority Carrier Lifetime in n-type Non-contact Crucible Silicon', Energy Procedia, vol. 92, pp. 779-784. https://doi.org/10.1016/j.egypro.2016.07.068
Castellanos, Sergio ; Kivambe, Maulid ; Jensen, Mallory A. ; Powell, Douglas M. ; Nakajima, Kazuo ; Morishita, Kohei ; Murai, Ryota ; Buonassisi, Tonio. / Exceeding 3 ms Minority Carrier Lifetime in n-type Non-contact Crucible Silicon. In: Energy Procedia. 2016 ; Vol. 92. pp. 779-784.
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